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Subthreshold Logic Energy Minimization with Application-Driven Performance. EE241 Final Project Will Biederman Dan Yeager. Outline. Motivation and Introduction Problem Analysis Prior Work Proposed Solution Design Procedure Minimum Energy Tracking Loop Results. Motivation.
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Subthreshold Logic Energy Minimization with Application-Driven Performance EE241 Final Project Will Biederman Dan Yeager
Outline • Motivation and Introduction • Problem Analysis • Prior Work • Proposed Solution • Design Procedure • Minimum Energy Tracking Loop • Results
Motivation • Emerging Markets: Wireless Sensors • Shipment tracking, biomedical electronics, environmental monitoring • Fixed Computation -> Minimize E/op • 10-year life applications (100k hrs) AAA Battery • > ~ 10 uA * Vdd
Introduction: Conventional MEP • Lowering E/op • Lower VDD! How Far? • Minimum Energy Point may not provide sufficient performance
Problem Analysis: Fop Set by MEP • Fop set by MEP (VDD) • Fop can change with environment conditions (T) • MEP doesn’t track with throughput demands • Wasted power during sleep or low computation
Problem Analysis: σVth • Variation in Vth • LER & RDF • Economics motivate continued technology scaling • ( Moore’s Law!! )
Prior Work: Adaptive Fop • Correlated Path Delay - Temp/Process - Critical path exceeds Tclk • Replica circuits can be used to compensate • ABB • AVS • These circuits cannot adapt to uncorrelated Vth variations from LER and RDF!
Prior Work: Dealing with σVth • σVth due to LER/ RDF • Spatially Uncorrelated • Upsizing- C increases • Pipeline Depth- α decrease) • Increase technology node (C increase & Moore’s Law)
Proposed Solution • Compensate for correlated temperature and process variation with an analog VTH sensor • Compensate for uncorrelated delay variation with timing error detection -> How do we optimize device sizing and pipeline depth in this regime?
Energy Optimization • Delay is stochastic:
Energy Optimization • Energy is also stochastic:
Energy Optimization • Its all pretty messy… how do we optimize? • Yield • Pick a target yield -> sets conf, (# of sigma) • Allocate half of the yield to timing and half to energy • YTotal = √(YEnergy + Ytiming) • Design • MATLAB model to find optimal design parameters • Choose Vdd_opt, Vth_opt, n (pipeline logic depth), etc. • Power On • Our tracking loop ensures that all chips meet the timing constraint, but at the expense of energy • We can quickly pass / fail chips based on the supply voltage set by the tracking loop
ABB (Adaptive Body Bias) • Optimal Vdd, Vth at some process node, freq is constant Optimal Body Bias at FF Corner Optimal Body Bias at SS Corner • Optimal body bias keeps Vth constant
Idea: Try to keep Vth constant Vdd Vdd/2 - bias sense + vbp Charge Pump vbn Charge Pump
Body Bias Correction Works! Process Corner Body Bias Voltage Temperature
Tracking Loop Results – No ABB VDD = 300mV ERROR Pipeline In/Out Timing: VDD = 175mV ERROR Pipeline In/Out Timing:
Tracking Loop Results – With ABB VDD = 225mV ERROR Pipeline In/Out Timing:
Conclusion • Maximum energy efficiency -> subthreshold operation -> serious variability problems • Correlated (P,T) vs. uncorrelated (RDF) variations • ex situ (replica) vs. in situ (timing detection) • ABB and DVS can effectively provide optimal region of operation
Energy Optimization • We are concerned with the longest of p critical paths: