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Asynchronous SRAM in 45nM CMOS NCSU Free PDK Paper ID: CSMEPUN-1011-033 International Conference on Computer Science and Mechanical Engineering 10 th November 2013, Pune Paper presented by: Nirav Desai, Assistant Professor, Dept. of ECE, ITM Universe
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Asynchronous SRAM in 45nM CMOS NCSU Free PDK Paper ID: CSMEPUN-1011-033 International Conference on Computer Science and Mechanical Engineering 10th November 2013, Pune Paper presented by: Nirav Desai, Assistant Professor, Dept. of ECE, ITM Universe Work done as a student at the University of Minnesota, Twin Cities Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie
Introduction • 6 Transistor SRAM design presented here. • Mainly used in Level 1 cache memories of microprocessors. • Low power and fast speed of memory access are design parameters. • Self timed design to provide immunity to process variations and adaptability to different clock speeds. Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie
SRAM Cell Design Design equations for 6T SRAM: 1. Read Operation Stability 2. Write Operation Stability Figure 1: M1, M3 are inverter pull down transistors. M2 and M4 are inverter pull up transistors. M5 and M6 are NMOS access transistors. BL is bit line and WL is word line. Source: Wikipedia 3. Minimum Cell Area 4. Reverse Short Channel Effect Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie
SRAM CELL READ AND WRITE MARGIN FROM BUTTERFLY CURVE • NMOS inverter = 110nM PMOS inverter = 220nM NMOS Access = 90nM • NMOSinv/NMOSaccess = 1.2 PMOSinv/NMOSaccess=2.4 • Cbitline = 0.747fF for 512 cell array ( Interconnect Parasitics from ASU PTM Website ) Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie
SRAM CELL READ AND WRITE MARGIN FROM BUTTERFLY CURVE • NMOS inverter = 150nM PMOS inverter = 555nM NMOS Access = 180nM • NMOSinv/NMOSaccess = 1.2 PMOSinv/NMOSaccess = 3 Cbitline = 0.747fF • Curve shows SRAM cell is close to write failure. • BitlinePrecharge to less than 1.1V could be explored to increase SNM. Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie
Simulation Setup V(word) V(ic) V(write) V(bit) V(bitbar) V(qbar) V(q) • M0,M1,M3,M4 form the cross coupled inverter pair • M5,M6 are access transistors • C1, C2 is the bitline capacitance • M7 is the precharge switch for bitline ( bit ) - V3 precharges the bitline to 0.8V • V6 prechargesbitbar and writes a 0 to the cell Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie
Timing Waveforms for Characterization V(write) – Applied to source of M7 (precharge switch) • V(write) prechargesCbit to 0.8V via M7 • V(word) disables access transistors • M5 and M6 during precharge . • V(qbar) and V(q) are used to generate • the butterfly curves. • V(ic) enables M7 during precharge • It could be implemented as NOT(V(word)). • V(bitbar) precharges to 0.8V, shows charge pumping when M7 turns off and follows V(qbar) when wordline is enabled. • V(bit) follows V(q) after word line is • enabled. • V(bit) precharged to Vdd by V6 V(word) – Wordline Voltage V(qbar) V(q) V(ic) – Enables the precharge switch M7 V(bitbar) V(bit) Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
PASS TRANSISTOR BASED TREE DESIGN 1:8 Row Decoder Tree a1 a2 a2 a0 a2 a1 a2 8 MSB BUFFERS in a2 a1 a2 a0 a1 a2 a2 Similar Tree Decoder for 16 LSB Bits Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
TREE DECODER DESIGN 23= 8 MSB Bits for Word Line Address from Row Buffers Directions of Increasing bit number 24 = 16 LSB Bits for Word Line Address from Column Buffers From row buffer To Word Line Buffer From column buffer Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
PASS TRANSISTOR BASED TREE DESIGN CK OUT IN CK Identical Sizing for NMOS and PMOS to minimize charge injection effects • Delay drops by ~40ps/2 for every • Doubling of transistor widths • Delay drop saturates around • 1000nM to 89ps • Used W/L of 880/50 for final tree Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
TREE DECODER TIMING DIAGRAMS The following waveforms were applied to the row and column selection inputs of the tree decoder Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
TREE DECODER TIMING DIAGRAMS It takes one cycle for initializing the tree decoder after which we get clean pulses for each row output LSB pulse is wider than MSB pulse in bottom figure to allow the tree to clear present state before next Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
TREE DECODER TIMING DIAGRAMS The top waveforms shows the matrix point output where the row and column select inputs are high The output node discharges when the input goes low Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
SRAM TIMING CIRCUIT Timing Sequence: Disconnect Precharge Enable Word Line SAE / Write Enable Wait for read/write Disble SAE/Write Enable Disable Wordline Reconnect Precharge and discharge all word lines SAE/Write Enable in Precharge Wordline Enable Read/Write Input Pulse Precharge Disable Pulse Word Line Enable Pulse Read/Write Output Pulse Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
READ WRITE CIRCUIT ( Design by Bong Jin ) Write Driver Sense Amplifier Precharge Circuit Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
READ WRITE CIRCUIT TEST SETUP Single SRAM Cell for simulations Cbitestimate for 512 rows NMOS Switches to allow read without disabling write circuit Bitline Capacitance estimate from ASU PTM Website Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
READ / WRITE TIMING WAVEFORMS Precharge Pulse ( Active Low ) Data Meant to be written to cell Write Enable Pulse Read Enable Pulse Output of Write Buffer Disable output buffer ( tristate logic ) Bitline Bitline Bar Data Output Data Out Bar Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
SRAM Cell Layout Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
2X2 SRAM Array Layout This unit can be replicated in all directions without any changes. LVS check remaining Array Size = 3.7975umX2.4725um B0 B0BAR B1 B1BAR GND WORD 1 VDD WORD 0 GND Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
Final Waveforms and Decoder Layout Left: Top waveform: Bitline and Bitline Bar waveforms for reading a 1 and Right: Layout of pass Transistor based tree decoder Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
References • Digital Integrated Circuits Jan Rabaey, AnanthaChandrakasan, BorivojeNikolic ( SRAM Cell Design, Decoders, Read Write Circuits ) • CMOS VLSI Design by Weste and Harris ( Butterfly Curves ) • CMOS Circuit Design, Layout and Simulation Baker, Li, Boyce (Decoder Design) • Course slides of Prof. Kia Bazargan ( Precharge Techniques, Decoders, SRAM Cell Design ) Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Cities
References (Contd.) • Design of High Performance Microprocessor Circuits by AnanthaChandrakasan, William Bowhill, Frank Fox • A High-Density SubthresholdSRAM with Data-Independent Bitline Leakageand Virtual-Ground Replica SchemeTae-Hyoung Kim, Jason Liu, John Keane, Chris H. Kim, University of Minnesota ISSCC 2007 • Digital Integrated Circuits by Jan Rabaey • Large-Scale SRAM Variability Characterization in 45 nm CMOS ZhengGuo, Student Member, IEEE, Andrew Carlson, Member, IEEE, Liang-Teck Pang, Member, IEEE, Kenneth T. Duong, Tsu-Jae King Liu, Fellow, IEEE, Borivoje Nikolic´, Senior Member, IEEE • IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 44, NO. 11, NOVEMBER 2009 • Dama, J.; Lines, A., "GHz Asynchronous SRAM in 65nm," Asynchronous Circuits and Systems, 2009. ASYNC '09. 15th IEEE Symposium on , vol., no., pp.85,94, 17-20 May 2009doi: 10.1109/ASYNC.2009.23 Prepared by: Nirav Desai Work done as a student at the University of Minnesota, Twin Citie