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X-ray Diffractometer: Instrument and Design

This chapter explores the instrument and design of an X-ray diffractometer, which is used for measuring X-ray spectra and studying crystalline materials. Topics include detector circuits, diffraction patterns, peak determination, temperature effects, and different methods of X-ray diffraction.

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X-ray Diffractometer: Instrument and Design

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  1. Chapter 6 ~ 8 Instrument and design of X-ray 繞射原理

  2. X-ray diffractometer 1. An instrument for measuring x-ray spectra by means of a crystal of known structure. 2. An instrument for studying crystalline (and noncrystalline) material by measurements of the way in which they diffract x-ray of known wavelength. 繞射原理

  3. Fig 6-3 Rigaku diffractometer 繞射原理

  4. 繞射原理

  5. Fig 6-3 Rigaku diffractometer 繞射原理

  6. Fig 6-4 detector circuits for a diffractometer 1. Continuous scan: starting/ending angle and scan speed 繞射原理

  7. Fig 6-4 detector circuits for a diffractometer 2. Step scan: starting/ending angle and scanning interval/time of each scan 繞射原理

  8. Fig 6-5 Diffraction pattern of NaCl powder. 繞射原理

  9. Determination of the peak position. 繞射原理

  10. X-ray detector sample chamber primary beam stop crossed Göbel Mirrors 2-D detector sealed X-ray tube X-ray generator 2-D detector with real time display 繞射原理

  11. A detector “sees” only the radiation to which it is exposed and is “blind” to all diffracted rays not only lying in the planes of the diffractometer circle. 2-D detector with real time display 繞射原理

  12. room temperature 150 °C 70 °C 80 °C 140 °C • temperature dependent position shift and intensity change of maxima 繞射原理

  13. 繞射原理

  14. X-ray diffraction pattern of polyimide 繞射原理

  15. Pinhole method in Transmission mode tan2 = U/2D Fig 7-14 Angular relationships in the pinhole method 繞射原理

  16. Background radiation 1. Fluorescent radiation emitted by the specimen 2. Diffraction of the continuous spectrum 3. Diffuse scattering from the specimens itself Compton modified scattering and coherent scattering 4.Diffraction and scattering from other than the specimen material 繞射原理

  17. tan2 = r1/D Fig 8-2 Transmission Laue camera 繞射原理

  18. tan(180-2) = r2/D Fig 8-4 Back- reflection Laue camera 繞射原理

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