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Application Report. Dr. Ya-Ching Yang phone: (02)86981212 #205 email: yaching.yang@bruker.com.tw. Experiments with New D2 PHASER. The measurements were made with the D2 Phaser diffractometer (θ-θ). Every samples were measured in the Bragg-Brentano geometry.
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Application Report Dr. Ya-Ching Yang phone: (02)86981212 #205 email: yaching.yang@bruker.com.tw
Experiments withNew D2 PHASER • The measurements were made with the D2 Phaserdiffractometer(θ-θ). • Every samples were measured in the Bragg-Brentano geometry. • The LynxEye fast linear detector was used for all measurements. • The powder samples were prepared in a standard PMMA sample holder (cavity diameter 25 mm and 1 mm depth). • The bulk samples were prepared in a standard PMMA sample holder (cavity diameter 40 mm and 5 mm depth). • The few amount powder samples & thin film samples were prepared in a standard Si low background sample holder. PMMA sample holder Si Low Background Sample Holder
Configuration of the diffractometer Bragg-Brentano Geometry
The LynxEye fast linear detector LynxEye TM detector
Quantitative Analysis in TOPAS • A phase quantification (based on the Rietveld method, see next slides) was performed using the TOPAS software. • The final phase ratio (in wt%) is displayed on the picture.
Sample 1110.raw – XRD patterns • The sample was measured from 20o(2θ) to 90°(2θ) with a step size of 0.02°(2θ) . • The counting time was 0.5 sec per step.
Quantitative Analysis in TOPAS Blue: raw data Red: calculated curve
Sample Si3N4_1 A phase identification was performed with the Diffrac.EVA software in combination with the PDF4+ database. Obviously, the sample contains two allotropic (alpha and beta) forms of Si3N4.
Sample Si3N4_1 Adjusting the height of the sticks to the measured intensity, a semi-quantitative estimation of the phase is automatically performed (based on I/Icor coefficients). The sample contains about 88.8 wt% alpha-Si3N4 and 11.2 wt% beta-Si3N4.
Quantitative Analysis in TOPAS A phase quantification (based on the Rietveld method, see next slides) was performed using the DiffracPlus TOPAS software. The final phase ratio (in wt%) is displayed on the picture. It is in very good agreement with semi-quantitative result.
Sample SiC A phase identification was performed with the Diffrac.EVA software in combination with the PDF4+ database. The sample contains two allotropic forms of SiC: 6h and 15R. Traces of quartz and silicon could also be detected.
Sample SiC Adjusting the height of the sticks to the measured intensity, a semi-quantitative estimation of the phase is automatically performed (based on I/Icor coefficients). The sample contains about 85 wt% SiC-6H, 14.3 wt% SiC-15R and traces of quartz and silicon.
Quantitative Analysis in TOPAS A phase quantification (based on the Rietveld method, see next slides) was performed using the DiffracPlus TOPAS software. The final phase ratio (in wt%) is displayed on the picture. It is in good agreement with semi-quantitative result.
Quantitative Analysis in TOPAS 高溫時,Corundum相消失
Crystallite Calculation in TOPAS Crystallite size determined by whole pattern with structure is ~110 Å
Crystallite Calculation in TOPAS Crystallite size determined by single line profile fitting with FP is ~135 Å
Phase Identification in DIFFRAC.EVA 34-0010 -Ca5(PO4)3(OH)-SG: P63/m (176) ,a=9.41480, c=6.87910 09-0169-Ca3(PO4)2, SG: R-3c (167) ,a=10.42900,c=37.38000
TOPAS analysis Peak phase analysis with FPA function Great GOF and its Rwp down to 7.8%(<10%)
TOPAS analysis Amorphous phase contents around 45%
TOPAS Analysis Deconvolution of Ca5(PO4)3(OH) Phase CS:247.9nm
Phase Identification in DIFFRAC.EVA CIGS/Mo/Glass
Phase Identification in DIFFRAC.EVA ITO/Glass
Samples Before Laser Annealing GST/Glass
Samples After Laser Annealing GST/Glass