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Supported by Cadence Design Systems, Inc. and MARCO/DARPA GSRC. Performance-Impact Limited Area Fill Synthesis. Yu Chen UbiTech, Inc. Puneet Gupta, Andrew B. Kahng Univ. of California, San Diego http://vlsicad.ucsd.edu. Outline. Chemical Mechanical Planarization and Area Fill
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Supported by Cadence Design Systems, Inc. and MARCO/DARPA GSRC Performance-Impact Limited Area Fill Synthesis Yu Chen UbiTech, Inc. Puneet Gupta, Andrew B. Kahng Univ. of California, San Diego http://vlsicad.ucsd.edu
Outline • Chemical Mechanical Planarizationand Area Fill • Performance-Impact Limited (PIL) Fill Problem • Capacitance and Delay Models • Approaches for PIL-Fill Problems • Computational Experiences • Conclusion and Future Works
Chemical-Mechanical Planarization (CMP) • Polishing pad wear, slurry composition, pad elasticity make this a very difficult process step silicon wafer slurry feeder wafer carrier polishing pad slurry polishing table • Area fill feature insertion • Decreases local density variation • Decreases the ILD thickness variation after CMP Post-CMP ILD thickness Features Area fill features CMP & Area Fill
w w/r tile Overlapping windows n Fixed-Dissection Regime • To make filling more tractable, monitor only fixed set of w w windows • offset = w/r (example shown: w = 4, r = 4) • Partition n x n layout intonr/w nr/wfixed dissections • Each w w window is partitioned into r2 tiles
Previous Objectives of Density Control • Objective for Manufacture = Min-Var minimize window density variation subject to upper bound on window density • Objective for Design= Min-Fill minimize total amount of added fill features subject to upper bound on window density variation
Previous Works on Area Fill • Kahng et al. • First LP-based approach for Min-Var objective • Monte-Carlo/greedy method • Iterated Monte-Carlo/greedy method • Monte-Carlo methods for hierarchical fill problem and multiple-layer fill problem • Wong et al. • LP-based approaches for Min-Fill objective • LP-based approaches for multiple-layer fill problem and dual-material fill problem
Outline • Chemical Mechanical Planarization and Area Fill • Performance-Impact Limited (PIL) Fill Problem • Capacitance and Delay Models • Approaches for PIL-Fill Problems • Computational Experiences • Conclusion and Future Works
Performance-Impact Limited Area Fill • Why? • Fill features insertion to reduce layout density variation change coupling capacitance change interconnect signal delay and crosstalk • Current methods: no consideration of performance impact during fill synthesis Timing Closure Error ? Filled layout
Related Works • General guidelines: • Minimize total number of fill features • Minimize fill feature size • Maximize space between fill features • Maximize buffer distance between original and fill features • Sample observations in literature • Motorola [Grobman et al., 2001] key parameters are fill feature size and buffer distance • Samsung [Lee et al., 2003] floating fills must be included in chip-level RC extraction and timing analysis to avoid timing errors • MIT MTL [Stine et al., 1998] proposed a rule-based area fill methodology to minimize added interconnect coupling capacitance
Performance-Impact Limited Area Fill • Problem Formulation • Two objectives: • minimize layout density variation due to CMP • minimize fill features' impact on circuit performance • In general, cannot minimize two objectives simultaneously • minimize one objective while keeping the other as constraints • Two formulations for PIL Fill problem • Min-Delay-Fill-Constrained (MDFC) objective • Max-MinSlack-Fill-Constrained (MSFC) objective
Min-Delay-Fill-Constrained Objective • Given • A fixed-dissection routed layout • Design rule for floating square fill features • Prescribed amount of fills in each tile • Direction of current flow in each tile • Per-unit length resistance for interconnect segment in each tile • Fill layout such that • Performance impact (i.e., total increase in wire segment delay) is minimized • Insert fill features into each tile such that • Total impact on delay is minimized • Weakness of MDFC objective • can not directly consider the impact due to fill features on the signal delay of complete timing paths
Max-MinSlack-Fill-Constrained Objective • Given • A fixed-dissection routed layout • Design rule for floating square fill features • Prescribed amount of fills in each tile • Fill layout such that • minimum slack over all nets in the layout is maximized
Outline • Chemical Mechanical Planarization and Area Fill • Performance-Impact Limited (PIL) Fill Problem • Capacitance and Delay Models • Approaches for PIL-Fill Problems • Computational Experiences • Conclusion and Future Works
Capacitance and Delay Models • Interconnect capacitance consists of • Overlap Cap. : surface overlap of two conductors • Coupling Cap. : two parallel conductors on the same plane • Fringe Cap. : two conductors on different planes • Mainly consider fill impact on coupling capacitance • Elmore Delay Model • First moment of impulse response for a distributed RC interconnect • Enjoys additivityproperty with respect to capacitance along any source-sink path
Additivity Property of ElmoreDelay Model • Elmore Delay of RC Tree
slack site column Slack Site Column • Grid layout with fill feature size into sites • Slack Site Column: column of available sites for fill features between active lines top view Active lines w fill grid pitch buffer distance • Per-unit capacitance between two active lines separated by distance d, with m fill features in one column:
Slack Site Column in Tile • Slack site columns in fixed-dissection regime • Between active line and tile boundary • Between active lines in adjacent tiles • Advantage • Possible impact of fill feature at any position can be considered 1 2 Tile A B C Active lines 3 7 slack blocks D E 4 5 F G 6
Scan-Line Algorithm • Find out slack columns (within each tile) between pairs of active lines in adjacent tiles • Scan whole layout from bottom (left) boundary for horizontal (vertical) routing direction 1 2 Tile A B C Active lines 3 7 slack blocks D E 4 5 F G 6
Outline • Chemical Mechanical Planarization and Area Fill • Performance-Impact Limited (PIL) Fill Problem • Capacitance and Delay Models • Approaches for PIL-Fill Problems • Computational Experiences • Conclusion and Future Works
ILP Approach for MDFC PIL-Fill • #RequiredFills obtained from normal fill synthesis • Objective: minimize weighted incremental delay due to fill features Minimize: : num of downstream sinks of segment • Based on pre-built lookup table for coupling capacitance calculation • Fill features have the same shape • Potential num of fill features in each column is limited • Other parameters are constant for the whole layout
ILP Approach for MDFC PIL-Fill • Constraints: Binary: 1. for each column 2. for all overlapping columns # used slack sites = # fill features 3.for each column incremental cap. due to features in each column 4.for each segment total Elmore delay increment 5.# used slack sites column size
Greedy Method for for MDFC PIL-Fill • Run standard fill synthesis to get #RequiredFills for each tile • For each net Do • Find intersection with each tile • Calculate entry resistances of net in its intersecting tiles • Get slack site columns by scan-line algorithm • For each tile Do • For each slack column Do • calculate induced coupling capacitance of slack column • Sort all slack columns according to its corresponding delay • While #RequiredFills > 0 Do • select slack column with minimum corresponding delay • insert features into the slack column
Partition the given layout into tiles and sites Run normal area fill synthesis: required fills (RFij) for each tile, total number of requires fills (RF) Scan whole layout to get all slack site columns Iterated Approaches for MSFC PIL-Fill • Pre-Steps: • Reduced Standard Parasitic Format (RSPF) file • Interface between Static Timing Analysis and fill synthesis • Iteration variables • LBslack: lower bound on slack value of slack site columns • UBdelay: upper bound on total added delay during one iteration
Choose slack site column k with maximum slack value Smax Run STA tool with RSPF file to get slacks for all input pins Yes Smax< LBslack Dadd > UBdelay Calculate slack for each active line Run STA max number of feasible fills for column k Calculate slack value for each slack site column min overlapping size of column k in tile Get #fills to be inserted for each tile intersecting with column k number of required fills for tile Calculate added delay Dadd Calculate max number of feasible fills for slack site column k Yes Update RSPF file with capacitance increase Decrease LBslack Yes No DF > 0 End Iterated Approaches for MSFC PIL-Fill
Outline • Chemical Mechanical Planarization and Area Fill • Performance-Impact Limited (PIL) Fill Problem • Capacitance and Delay Models • Approaches for PIL-Fill Problems • Computational Experiences • Conclusion and Future Works
Computational Experience • Testbed • C++ under Solaris • CPLEX 7.0 as linear programming solver • 300 MHz Sun Ultra-10 with 1GB RAM • Test cases • In LEF/DEF format • Signal delay calculation based on RSPF file • Use previous LP/Monte-Carlo methods as normal fill synthesis (Chen et al. TCAD02)
Experiments for MDFC PIL-Fill • PIL-Fill methods are better than normal fill method • LUT based ILP has better performance but longer runtime
Experiments for MSFC PIL-Fill • Iterated greedy method for MSFC PIL-Fill only decrease minimum slack of all nets by 7% (min), 20% (average), 37% (max) significant improvement
Outline • Chemical Mechanical Planarization and Area Fill • Performance-Impact Limited (PIL) Fill Problem • Capacitance and Delay Models • Approaches for PIL-Fill Problems • Computational Experiences • Conclusion and Future Works
Contributions: Approximation for performance impact due to area fill insertion First formulations for Performance-Impact Limited Fill problem ILP-based and greedy-based methods for MDFC PIL-Fill problem Iterated greedy-based method for MSFC PIL-Fill problem Conclusions and Future Research • Future Works • Budget slacks along segments avoid iteration with STA • Consider impact due to fill on overlap and fringe capacitance • Other PIL-Fill formulations • Min density variation while obeying upper bound on timing impact