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RIFLE : a R esearch I nstrument for FL ash E valuation

RIFLE : a R esearch I nstrument for FL ash E valuation. A ctive T echnologies. DEMO. This file contains a demo of RIFLE’s use RIFLE’s hardware features, software structure, and performances are shown in the Rifle presentation file

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RIFLE : a R esearch I nstrument for FL ash E valuation

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  1. RIFLE: aResearchInstrumentforFLashEvaluation Active Technologies

  2. DEMO This file contains a demo of RIFLE’s use RIFLE’s hardware features, software structure, and performances are shown in the Rifle presentation file This demo has been designed for Office 2002, but it may run quite well under Office 2000 Active Technologies - RIFLE demo - October 2003

  3. Index Select the section to visit by clicking on the section name DUT parameters and constrains definitions(1 min. 30”) Standard measurements execution(8 min 15”) Waveform generation, program/erase(3 min 50”) Preparation and execution of customized cycles(4 min. 45”) Post-cycle data analysis(3 min.) End of presentation Active Technologies - RIFLE demo - October 2003

  4. Selecting a DUT When RIFLE is started, the user can select among already installed DUT, or modify an already installed DUT, or create a new DUT Active Technologies - RIFLE demo - October 2003

  5. DUT parameter and constrains definition DUT parameters, organization, structure, constrains, allowed measurements must be defined just once They can be modified at any time Active Technologies - RIFLE demo - October 2003

  6. DUT parameter and constrains definition All RIFLEs’ functions may be executed on specific working areas defined by the user The working area meaning and limits are strictly related to the device architecture and organization Active Technologies - RIFLE demo - October 2003

  7. DUT parameter and constrains definition Voltage constrains and specific enables are set for any cell terminal Active Technologies - RIFLE demo - October 2003

  8. DUT parameter and constrains definition Constrains for PMU (Precise Measuring Unit) and power supply are also here defined Active Technologies - RIFLE demo - October 2003

  9. DUT parameter and constrains definition Among the available RIFLE functions, the user can select the ones to be activated for the specific DUT… Active Technologies - RIFLE demo - October 2003

  10. DUT parameter and constrains definition … as well as specific function parameters … Active Technologies - RIFLE demo - October 2003

  11. DUT parameter and constrains definition … or working areas properties … Active Technologies - RIFLE demo - October 2003

  12. DUT parameter and constrains definition … and post-analysis functions to be executed after cycling Active Technologies - RIFLE demo - October 2003

  13. End of Section Make your choice by using the PC mouse Index page End of presentation Active Technologies - RIFLE demo - October 2003

  14. Executing standard measurements Any measurement can be set up and launched in a completely graphical environment developed under the National Instruments LabVIEW platform Active Technologies - RIFLE demo - October 2003

  15. Executing standard measurements By means of a navigator window it is possible to set up the parameters for any measurement (program, erase, IV measures, distributions and maps, stresses, ..), to browse among 2D and 3D maps and distributions of threshold voltages or current gains, 2D and 3D I-V characteristics Active Technologies - RIFLE demo - October 2003

  16. Executing standard measurements For any measurement type specific working areas can be defined User defined combinations of working areas will be activated at run-time Active Technologies - RIFLE demo - October 2003

  17. Parameters setting For any measurement, the appropriate setting can be chosen by the user or loaded from the PC memory Setting can also be saved for further applications or saved as new default For example, for a threshold distribution… Active Technologies - RIFLE demo - October 2003

  18. Parameters setting The user can select the working areas where a distribution is to be calculated Active Technologies - RIFLE demo - October 2003

  19. Parameters setting Initial, final voltage and voltage step can be chosen by the user Active Technologies - RIFLE demo - October 2003

  20. Parameters setting Additional options can be defined when implementing the DUT driver (for example, calculate the threshold distribution on selected pads) Active Technologies - RIFLE demo - October 2003

  21. Parameters setting Distribution settings can be loaded from the PC memory, saved for further applications or saved as new default Active Technologies - RIFLE demo - October 2003

  22. Threshold distributions Threshold distributions can be easily calculated They are plotted just at the end of the measure Active Technologies - RIFLE demo - October 2003

  23. Threshold distributions Statistical information are immediately available: • distribution width • distribution mean value • distribution standard deviation • total number of cell within the range • number of cells out of range Active Technologies - RIFLE demo - October 2003

  24. Threshold distributions Also for all the other measurement types (maps, IV characteristics, identification of set of cells, …) the results can be loaded or saved Distributions can also be loaded, saved, or saved as ASCII file for further analysis Active Technologies - RIFLE demo - October 2003

  25. Threshold distributions Several distributions can be plotted simultaneously Active Technologies - RIFLE demo - October 2003

  26. Threshold distributions Distributions can be plotted in linear … Active Technologies - RIFLE demo - October 2003

  27. Threshold distributions … or in log scale Active Technologies - RIFLE demo - October 2003

  28. Threshold distributions as cumulative distributions… Active Technologies - RIFLE demo - October 2003

  29. Threshold distributions … or log-normal distributions Active Technologies - RIFLE demo - October 2003

  30. Threshold maps Threshold maps can be calculated on selected working areas and immediately plotted Active Technologies - RIFLE demo - October 2003

  31. Threshold maps All LabVIEW graphic potentialities can be used for zoom, change of scale, … Active Technologies - RIFLE demo - October 2003

  32. Threshold maps Information (address and threshold range) of the cell at red cursor are immediately available Active Technologies - RIFLE demo - October 2003

  33. Threshold maps Red cursor can be moved by the PC mouse or forced in a cell location by entering its coordinates Active Technologies - RIFLE demo - October 2003

  34. Threshold maps The two yellow cursors can be used to select an area for a 3D representation Active Technologies - RIFLE demo - October 2003

  35. Threshold maps Yellow cursors can be moved by the PC mouse or forced in two cell locations by entering their coordinates Active Technologies - RIFLE demo - October 2003

  36. Threshold maps A 3D zoom can be simply performed at a mouse click Active Technologies - RIFLE demo - October 2003

  37. Threshold maps The 3D representation can also be plotted in the main graphic area Active Technologies - RIFLE demo - October 2003

  38. Threshold maps All LabVIEW graphic potentialities can be used for graph rotation, change of scale,… Active Technologies - RIFLE demo - October 2003

  39. Identification of set of cells Cells satisfying specific criteria can be immediately identified in a user-selected working area Active Technologies - RIFLE demo - October 2003

  40. Identification of set of cells Preinstalled criteria are: • N cells with the lowest or highest threshold • N cells at a specified threshold • Cells below or above a specified threshold • Cells in a specified threshold range • N random cells (to be used as a reference set) Active Technologies - RIFLE demo - October 2003

  41. Identification of set of cells Addresses and thresholds of the cells satisfying the selected criterion are listed and their physical location is shown Active Technologies - RIFLE demo - October 2003

  42. Identification of set of cells By clicking on a list row, the physical position of the selected cell is shown Active Technologies - RIFLE demo - October 2003

  43. IV characteristics 2D and 3D characteristics can be measured for any matrix or reference cell Gate voltages and drain voltages (for 3D characteristics) are chosen by the user Cell address is also selected by the user Active Technologies - RIFLE demo - October 2003

  44. 2D IV characteristic Several characteristics can be plotted simultaneously Active Technologies - RIFLE demo - October 2003

  45. 3D IV characteristic All LabVIEW graphic potentialities can be used for graph rotation, change of scale,… Active Technologies - RIFLE demo - October 2003

  46. Single cell threshold calculation The threshold voltage of any user-selected cell can be immediately calculated Threshold voltage is calculated as the gate voltage corresponding to a user-defined drain current Active Technologies - RIFLE demo - October 2003

  47. Single cell threshold calculation Active Technologies - RIFLE demo - October 2003

  48. Current and Gain measurements All measurements shown for threshold voltages (distributions, maps, single cell,…) can be performed for current and current gain Active Technologies - RIFLE demo - October 2003

  49. Drain and Gate stresses Drain stress and gate stress can be easily activated For example, for a drain stress… Active Technologies - RIFLE demo - October 2003

  50. Drain and Gate stresses for the selected working area, drain voltage and stress duration can be chosen by the user Active Technologies - RIFLE demo - October 2003

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