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Designing Synchronization Sources in a Network Element. Dejan Habic Raltron Electronics Corp. dhabic@raltron.com. Agenda. A generic timing system solution in NE Clock cards architecture Line cards synchronization sources Performance Evaluation and test results examples. HF PLL. PLL.
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Designing Synchronization Sources in a Network Element Dejan Habic Raltron Electronics Corp. dhabic@raltron.com
Agenda • A generic timing system solution in NE • Clock cards architecture • Line cards synchronization sources • Performance Evaluation and test results examples
HF PLL PLL Framer (OCx) PLL Framer (OCx) Framer (DSx) HF PLL Framer (DSx) Clock Clock Host mP Input Input Host mP Line Card 1 Line Card 2 System Clock Card 2 System Clock Card 1 Line Card n+1 Line Card n A Generic Timing Solution in NE Back plane DS1,E1,Bits In
A Generic Timing Solution – attributes • Functionality • Performance • Redundancy or overall robustness of the system. • Automatic respond to all external or internal events at all levels. • Alarm and status signal messages. • Control interface to the all elements of the system.
Clock Card Architecture - general issues • Number of external reference inputs • Number of output signals required • Selecting the local oscillator (LO) for required quality of the clock • Filtering algorithms • Reference qualification • Phase transient suppression • Holdover performance • Switching between the modes • Master-slave operation of the two clocks
t Phase Detector & MUX VCXO DAC Loop Filter & Control Clock Architecture – SPLL type 1
Clock Architecture – SPLL type 1 • Supports all modes of operation (locked, holdover and free-run) • Loop parameters can be optimized in software and changed dynamically during operation • Easy to achieve low bandwidth PLL • Easy to change in software for different requirements (timing; switching) • Temperature and other stability compensation of the LO can be implemented. • Digital noise in the loop • High-pull VCXO and DAC are issues to consider.
T,U,... Phase Detector & MUX Free Running Oscillator DDS Loop Filter & Control Output Synthesizer Clock Architecture – SPLL type 2
Clock Architecture – SPLL type 2 • Supports all modes of operation (locked, holdover and free run) • Easier to achieve higher accuracy of the clock (e.g. Stratum 3E). • Oscillator is free running reference • Easier to control the loop • Loop parameters can be optimized in software and changed dynamically • Easy to achieve low bandwidth • Easy to change in software for different requirements (timing; switching) • Various disciplining algorithms for control of the LO can be implemented. • Digital noise in the loop • Phase noise and spurious due to DDS should be carefully considered.
Line Cards Timing – General Issues • Generate highest possible frequency required by system with the cleanest output signal – crystal or SAW based oscillators. • The output oscillator should be with very good jitter performance – avoid signal multiplication if possible, using high frequency fundamental crystal technologies • The PLL should be optimized with respect to in/output frequencies, possible transients during switching etc… • Should provide smooth switching between two references. • Should provide control interface, statuses and alarm messages.
MUX & Control VCXO PLL Line Cards Timing – Switching + PLL Reference 1 To Framer Reference 2 Statuses, Alarms and Control
Line Cards Timing – Switching + PLL • Simple analog implementation of PLL with low jitter frequency source at the output. • Provide automatic switching between two references. • Possible to implement a “hit-less” switching. • Interface for status, control and monitoring. • Different frequency sources require new optimizations of the loop. • Influence of temperature, aging and other environmental effects on the frequency source should be considered.
Characterizing the behavior of the system • Parameters and behavior are well defined and specified by international recommendations (BellCore, ANSI, ITU-T, ETSI). • Important to ensure that the system complies with the recommendations. • Prove system performance.
Measurement and Analysis • Determine measurement equipment • Determine set up of the equipment for specific measurements • Follow the measurement procedures • Measurements • Analysis and interpreting the results
The types of measurements • Frequency accuracy – (ppm) • Pull-in, Hold-in… – (ppm) • Jitter and wander generation (TIE, MTIE, TDEV) • Wander tolerance – (TIE, MTIE, TDEV) • Holdover performance – (TIE, MTIE, f(T,t)…) • Switching and transient – (TIE, MTIE) • Other tests such as environmental tests…
Measurement – wander generation • Wander generation – the amount of noise produced at the output when an ideal input is applied. • Signal with white noise applied at the input. • Measured TIE for a given observation time period • Calculate MTIE and TDEV
Measurement – wander tolerance • Wander tolerance – the tolerable level of noise at the input, while keeping the output within the recommended limits. • signal with known/specified noise distribution applied at the input • Measure TIE for a given observation time period • Calculation of TDEV • The system should operate without any alarm, switch reference or to holdover mode.
Measurement – reference switching • Behavior of the output during reference switching - output phase transient. • The unit is locked to one reference and then switched to another one. • Measure TIE during that period • Calculate MTIE
Measurement – 1ms transient • The response of the output phase when a 1ms phase transient is applied at the input. • The unit is locked to the reference when the transient is generated. • Measure TIE during the event. • Calculate MTIE. • Evaluate PLL parameters - damping factor, peaking…
Measurement – 1ms transient with phase build-out implemented • The response quite different when phase build-out feature is implemented.
Measurement – holdover performance • The whole set of test that characterize holdover operation. • Initial frequency offset. • The frequency offset due to temperature changes. • The frequency offset due to aging. • The additional frequency offset.
Measurement – environment testing • Parameters’ testing over extreme environmental conditions (e.g. wander generation as a function of temperature). • TIE measurement while exposing the DUT to temperature variations. • External variations of environmental conditions may effect power supply stability, performance under vibrations, humidity, etc…
Summary • Understand all the requirements of synchronization for a particular product. • Determine specifications and performances to be achieved. • Determine the role of each element in the system and integration impact amongst them. • Select and evaluate each components in the system. • Integrate a system. • Test and characterize it.