10 likes | 165 Views
Reference Model for Project CODE. Test. Sort. Fab. Bump. Tape and Reel. Back Grind. SLT. Assy. Die. Un Bumped Wafer. Bumped Wafer. Sorted Wafer. FG. PFG/FG*. Assembly. Back Grinded Die. Direct Sort Flow (Wafer Buy). Direct Sorted Wafer Buy. Assembly Flow. PFG to FG Flow.
E N D
Reference Model for Project CODE Test Sort Fab Bump Tape and Reel Back Grind SLT Assy Die Un Bumped Wafer Bumped Wafer Sorted Wafer FG PFG/FG* Assembly Back Grinded Die Direct Sort Flow (Wafer Buy) Direct Sorted Wafer Buy Assembly Flow PFG to FG Flow Test Flow • Supply Plans generated for: • Fab- Sort • Die inv to FG • SLT/T&R adhoc runs • Focus on data, priorities, rules and system-generated supply plans PFG to FG Flow PFG Postponement Flow Direct Flow * Test out part numbers for Direct Flow only. Required for capacity planning in SLT