Material Dependence of NBTI Stress & Recovery in SiON p-MOSFETs
Material Dependence of NBTI Stress & Recovery in SiON p-MOSFETs. S. Mahapatra, V. D. Maheta, S. Deora, E. N. Kumar, S. Purawat, C. Olsen 1 , K. Ahmed 1 , A. E. Islam 2 , M. A. Alam 2 Department of Electrical Engineering, IIT Bombay, Mumbai, India
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