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Electron Beam Lithography and Nanofabrication. Exposure. Electron Beam. High M M PMMA Low M M PMMA Indium Tin Oxide Glass. Bilayer e-beam resist structure. A high molecular weight PMMA is spun on top of a slightly more sensitive bottom layer of low melecular weight PMMA. Development.
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Electron Beam Lithography and Nanofabrication Exposure Electron Beam High MM PMMA Low MM PMMA Indium Tin Oxide Glass Bilayer e-beam resist structure. A high molecular weight PMMA is spun on top of a slightly more sensitive bottom layer of low melecular weight PMMA. Development Metal deposition Liftoff The resist is developed in MIBK:IPA giving an undercut. The resist is removed in a liquid solvent leaving the pattern.