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STATUS OF THE CHARATERIZATION PROGRAM AT ANL

This document provides an overview of the status and scope of the characterization program discussed at the LAPD Collaboration Meeting held on October 15-16, 2009. It covers various parameters of interest and methods used for material characterization, including chemical composition, chemical states of atoms on the surface, and electron structure. It also includes simulations, schematic designs, and instruments used for photoelectron yield measurements and electron trajectories in LEED systems.

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STATUS OF THE CHARATERIZATION PROGRAM AT ANL

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  1. STATUS OF THE CHARATERIZATION PROGRAM AT ANL Alexander Zinovev LAPD Collaboration Meeting, October 15-16, 2009

  2. SCOPE OF CHARACTERIZATION • Secondary Electron Emission Yield (SY) vs. Electron Energy • Photoemission Yield (PY) vs. Photon Density end Photon Energy Parameters of Interest Material Characterization • Chemical Composition • Chemical States of Atoms on the Surface • Electron Structure Methods • X-ray Photoelectron Spectroscopy (XPS) • Ultraviolet Photoelectron Spectroscopy (UPS)

  3. SEE measurements collector target + + Power Supply Power Supply

  4. SIMION Simulations of Electron Trajectories in LEED System

  5. 3-D View of field distribution in LEED electrodes system

  6. Photoelectron Yield Measurements collector target Light + Telescope - Power Supply Power Supply Light source Monochromator

  7. Schematic Design of the Instrument X-ray gun Ion gun Energy analyzer Gate valve Spherical collector Electron gun Load-lock chamber Entrance of energy analyzer

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