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Efficiency Testing at SU Marina Artuso & Jianchun Wang, Syracuse University

This study conducted by Jianchun Wang at Syracuse University on 10/02/2000 focused on the test setup for efficiency analysis. Parameters like V0, mV.s, Vpulse, and distribution capacity were measured. The test included 87 cells (row: 0-86, col: 3-17) with specific voltage scan steps and events recorded per point. The findings indicate threshold charge and voltage values. The system, designed for FPIX1 readout chip, is being modified for FPIX0. Future plans involve X-ray source calibration with FPIX0 connected to ATLAS sensor.

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Efficiency Testing at SU Marina Artuso & Jianchun Wang, Syracuse University

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  1. FPIX1 Calibration at SU Marina Artuso Jianchun Wang Syracuse University 10/02/2000

  2. Test Setup Jianchun (JC) Wang

  3. col: 10 row: 10 Efficiency V0 = 80.86 mV s = 0.73 mV Vpulse (mV) Efficiency Distribution Capacity: 6 f F (37.5 e / mV) Threshold: 3032 e Noise: 27 e Jianchun (JC) Wang

  4. Mean = 3134 e Width = 292 e Threshold 0 ( 1000 e) Threshold • 15  87 cells tested (row: 0-86, col: 3-17) • Voltage scan step: 0.5 mV • 25 events per point Jianchun (JC) Wang

  5. Threshold Charge ( x 1000 e) Threshold Voltage (V) Threshold FIT: Charge (ke) = - 17.19  ( V - 2.366 ) Jianchun (JC) Wang

  6. Mean = 26.6 Sigma = 3.1 Noise ( electrons ) Noise • Only threshold 0 studied • Fine step: 0.175 mV • 100 events per point Jianchun (JC) Wang

  7. Summary • Threshold and noise measured, consistent with measurements at Fermilab • The system works fine with FPIX1 readout chip • The boards are being adapted to FPIX0 readout chip • X-ray source calibration will be performed on FPIX0 attached to ATLAS sensor Jianchun (JC) Wang

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