1 / 11

Preparation for silicon sensor arrival

Comprehensive QA plan and testing procedures for upcoming L2-L5 sensor deliveries. Key tests, personnel assignments, and irradiation protocols outlined.

ryans
Download Presentation

Preparation for silicon sensor arrival

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Preparation for silicon sensor arrival • sensor delivery schedule aggressive • expect 130 L2-L5 sensors each in July and August • sensor lot/batch will likely be in the order of 50-70 • from 9/2003 until 4/2004 270 L2-L5 sensors each month • first L0/L1 (110 pcs) sensors in October 2003 (but effectively later) Frank Lehner U Zurich

  2. Silicon sensor arrival - preparation • We have a detailed QA plan with established procedures • All people involved in that business should check on http://www.physik.unizh.ch/~lehnerf/dzero/qa/qa.html • QA document v4.0 • definition of tests • general procedures for testing • Sensor QA part flow v2.0 • detailed part flow for testing • timing estimates • Procedures for visual inspection v1.0 • Guidelines for clean room and sensor S&H v2.0

  3. Sensor arrival - preparation • Key tests: • initial registration into DB • checking paperwork from vendor • inserting vendor info into “vendor information spreadsheet” -> perl script -> database • visual inspection • follow visual inspection guidelines • use traveler form during inspection (form attached to visual inspection guide line) • insert visual inspection comments into “key test spreadsheet” • I-V and C-V • data go into “key test spreadsheet” • all L2-L5 sensor key tests at FNAL • Technician for DB and visuals: Nina Ronzhina • Physicists for IV & CV: Md Mao/R.Lipton

  4. Sensor arrival – preparation • 10% L2-L5 full strip test (FST) at KSU (35%) & SB (65%) • sensors selected for FST by RD and FL • FST information goes into “full strip test spreadsheet” -> perl -> database • 5% sensors are subject to long term bias test at FNAL (Md. Mao/R. Lipton) • selection based on visual inspection and I-V results from key tests • initially 10% sensors per batch will be mechanically measured on OGP at FNAL • agreement what to measure: thickness, flatness, cut tolerances 2x (sides and ends) • sensors which show chips/cracks at edges have to be measured • not yet an agreement on data format

  5. Sensor arrival – preparation • irradiation test at KSU • 1.5% of the sensors (irradiation on baby detector) • two irradiation steps up to 2.5·E13 10 MeV p/cm2 • irradiate roughly half of the baby detectors which are at KSU anyway for FST tests • L0 & L1 baby detectors have to be shipped from UR to KSU for irradiation (do we need a higher dose for them?)

  6. Sensor QA plan

  7. Sensor arrival – preparation questions • Questions: • Is Nina trained for visual inspection? • Is the visual inspection station in Lab A ready? • When do we have the vendor information and key test spreadsheet ready? • Do we have dry boxes for sensor storage at FNAL? • Are the programs for the mechanical measurements on the OGP written? • Is the output format defined?

  8. L0/L1 PRR preparation • L0/L1 PRR will be on August 8th, 9 a.m. CT • documents & infos posted on http://www.physik.unizh.ch/~lehnerf/dzero/prr/prr_l1.html • following documents are prepared or have to be prepared/finalized • Note on electrical characterization of L1 sensors • editor: Marcel • status: 1st version exists • plots and results are there, need only additional layout work • I will finalize it • Note on irradiation of L1 sensors • editor: Frank • status: 2nd version • plots and results are there • however results on strip capacitance are a very weak point, went up from 1.1 pF/cm to 1.5 pF/cm • no reults on coupling capacitor value after irradiation • no results on strip capacitance versus HV after irradiation

  9. L0/L1 PRR preparation • Note on comparison of strip measurements between SB and KSU • editor: Bob • status: 2nd version exists (from July) • gives a very nice overview, shows the overall good agreement between KSU and SB on many measurements with some exceptions though • to be included in electrical sensor characterization note or separate note ?? • Note on fluence determination and dosimetry checks at KSU irradiation facility • editor: Tim • status: 2nd version exists (from July) • contains leakage current vs. fluence plots which are also in the other note • foil activation double check between FNAL & KSU within ~20%

  10. L0/L1 PRR preparation • older note on L2 irradiation document for L2-L5 PRR from March 6, 2003 • editor: Regina & Tim • status: unchanged • do we need an update of this at all? • other existing notes: • quality assurance document v4.0 • visual inspection guidelines v1.0 • sensor S&H document v2.0 • generally in good shape …

  11. L0/L1 PRR preparation • all documents released to PRR by July 25 (i.e. two weeks in advance) • everybody, please read and send comments in to all notes by latest July 20 • again, the notes are posted on: • http://www.physik.unizh.ch/~lehnerf/dzero/prr/prr_l1.html

More Related