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WCR #7 Nyquist rate ADC

WCR #7 Nyquist rate ADC. Main design motivation: Low Power Features: Pipeline arquitecture. Two interleaved ADCs with shared opamps: Efficient use of the most power demanding blocks. 1.5 bits/stage and digital correction: Relaxed comparator design. Good linearity.

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WCR #7 Nyquist rate ADC

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  1. WCR #7 Nyquist rate ADC • Main design motivation: Low Power • Features: • Pipeline arquitecture. • Two interleaved ADCs with shared opamps: • Efficient use of the most power demanding blocks. • 1.5 bits/stage and digital correction: • Relaxed comparator design. • Good linearity. • Target Specifications: • 40 Msamples/sec. 10-bit resolution. • Distortion and Noise below –60 dB.

  2. WCR #7 Nyquist rate ADC • Pipeline ADC • Test chip • 4K devices • 0.25 m CMOS • SIMULATION RESULTS • Power: 12 mW @ 2.5 V • (~2/3 less than publishied ADCs) • INL: 0.38 LSB  -62 dB Harm. Dist.

  3. WCR #7 ADC: Experimental DATA Experimental Setup:

  4. WCR #7 ADC: Experimental DATA • Measured Results: • Sampling Rate: 40 MHz (still running @ 60 MHz) • Latency: 12 cycles (300 ns) • Power: • ADC: 13.87mW (5.55 mA @ 2.5V) • Pin Drivers: 1.32mW (0.4 mA @ 3.3V) • Distortion: 0.3 to 0.65LSBs • ENOB: 9.4 bits (from distortion)

  5. WCR #7 ADC: Experimental DATA Single-Tone test Low Freq. (20 KHz) Very low Distortion

  6. WCR #7 ADC: Experimental DATA 2-Tone test Low Freq. (100 KHz) Very low Distortion

  7. WCR #7 ADC: Experimental DATA 2-Tone test High Freq. (19.5 MHz) Still good Linearity

  8. WCR #7 ADC: Experimental DATA 2-Tone test High Freq. (20 MHz) 60 MHz CLK (50% Overclock) Still running

  9. WCR #7 ADC: Experimental DATA LINEARITY from Code Density Histogram (Doernberg et al.) 60 KHz input • Too much ripples (bad code coverage?) • Monotonic, no missing codes.

  10. WCR #7 ADC: Experimental DATA LINEARITY from Code Density Histogram (Doernberg et al.) 20 KHz input (not full-scale) MAX INL = 0.65 LSB  (INL) = 0.3 LSB MAX DNL = 0.38 LSB

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