'05 nm' presentation slideshows

burster

417 views • 24 slides

burster

500 views • 24 slides

Optical Characterization Techniques

Optical Characterization Techniques. Reflection Microscopy Ellipsometry Reflectance. Emission PL UPS. Incident Photons. Absorption Photoconductivity. Inelastic Scattering Raman Brillouin. Transmission Transmittance FTIR. Optical Characterization Techniques.

760 views • 19 slides

Optical Characterization Techniques

Optical Characterization Techniques. Reflection Microscopy Ellipsometry Reflectance. Emission PL UPS. Incident Photons. Absorption Photoconductivity. Inelastic Scattering Raman Brillouin. Transmission Transmittance FTIR. Optical Characterization Techniques.

377 views • 19 slides

C8-200nm-509

C8-200nm-509. 052109. ? from triple-Gaussian peak. Peak value from triple Gaussian. Log-Normal Fit for ?. Fit mininum = 38.8E-15 m 2 = 124% of expected (31.4E-15 m 2 ). Fit mininum = 1.34nm Expected approx. 1.05 nm.

272 views • 8 slides

C8-200nm-509

C8-200nm-509. 052109. ? from triple-Gaussian peak. Peak value from triple Gaussian. Maxwell Distribution Fit for ?. w[1]*( (x*w[0])^2 )/(exp( (x*w[0])^ 2 )). Peak value from Maxwell Distribution. Fit mininum = 34.0E-15 m 2 = 108% of expected (31.4E-15 m 2 ). Fit mininum = 1.25nm

181 views • 8 slides