'Automatic test equipment ate' presentation slideshows

EE582 SoC Design & Test

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Digital Testing: Built-in Self-test

Digital Testing: Built-in Self-test. Outline. BIST and embedded testing Why BIST Primitive polynomials LFSR Response compression BILBO. Define Built-In Self-Test. Implement the function of automatic test equipment (ATE) on circuit under test (CUT). Hardware added to CUT:

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Lecture 21alt BIST -- Built-In Self-Test (Alternative to Lectures 25, 26 and 27)

Lecture 21alt BIST -- Built-In Self-Test (Alternative to Lectures 25, 26 and 27). Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

353 views • 28 slides

VLSI Testing Lecture 14: Built-In Self-Test

VLSI Testing Lecture 14: Built-In Self-Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 26, 2013, 2:30-3:30PM. Contents.

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Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering

ELEC 5970-001/6970-001(Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits Test Power. Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University http://www.eng.auburn.edu/~vagrawal

394 views • 25 slides

2003 Beijing Microelectronics International Symposium

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