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Beam settings slide 7 - PowerPoint PPT Presentation

Scanning Electron Microscope (FEI Sirion) Training Notebook

Scanning Electron Microscope (FEI Sirion) Training Notebook. NanoTech User Facility (NTUF) Center for Nanotechnology University of Washington April 2008 (rev. 8). SEM Operation Procedure. Initiate Software Load Sample Beam Settings Calibrate Stage Height Beam Optimization

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Beam settings slide 7 - PowerPoint PPT Presentation

Scanning Electron Microscope (FEI Sirion) Training Notebook