'Hidetoshi onodera kyoto university' presentation slideshows

Worst-case Delay Analysis Considering the Variability of Transistors and Interconnects

Worst-case Delay Analysis Considering the Variability of Transistors and Interconnects. Takayuki Fukuoka, Tsuchiya Akira and Hidetoshi Onodera Kyoto University. Outline. Motivation Worst-delay Analysis Classification of the Worst-delay Direction Conclusions. Motivation. Technology scaling

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