'Ideal tests' presentation slideshows

EE582 SoC Design & Test

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ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTES

ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTES. Motivation and Introduction. Overview. Motivation About the Course and the Instructor Conduct Outline Coursepack Introduction VLSI realization process Contract between design house and fab vendor Test v/s verification

338 views • 25 slides

VLSI Testing

VLSI Testing. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal August 7-13, 2010. Course Description.

552 views • 20 slides

VLSI Testing Lecture 1: Introduction

VLSI Testing Lecture 1: Introduction. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 24, 2012, 3:00-4:00PM. Course Description.

214 views • 20 slides

VLSI Testing Lecture 1: Introduction

VLSI Testing Lecture 1: Introduction. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 17, 2013, 10:00-11:00AM. Course Description.

226 views • 20 slides

Design for Testability Theory and Practice

204 views • 18 slides

Lecture 1 Introduction

Lecture 1 Introduction. VLSI realization process Verification and test Ideal and real tests Costs of testing Roles of testing A modern VLSI device - system-on-a-chip Course outline Part I: Introduction to testing Part II: Test methods Part III: Design for testability.

304 views • 16 slides