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Chapter 4

Chapter 4

Chapter 4. Test Generation. What is this chapter about?. Introduce the basic concepts of ATPG Focus on a number of combinational and sequential ATPG techniques Deterministic ATPG and simulation-based ATPG Fast untestable fault identification ATPG for various fault models. Test Generation.

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1.82k views • 154 slides
Chapter 4

Chapter 4

Chapter 4. Test Generation. What is this chapter about?. Introduce the basic concepts of ATPG Focus on a number of combinational and sequential ATPG techniques Deterministic ATPG and simulation-based ATPG Fast untestable fault identification ATPG for various fault models. Test Generation.

★ ★ ★ ★ ★

1.55k views • 154 slides
Chapter 4

Chapter 4

Chapter 4. Test Generation. What is this chapter about?. Introduce the basic concepts of ATPG Focus on a number of combinational and sequential ATPG techniques Deterministic ATPG and simulation-based ATPG Fast untestable fault identification ATPG for various fault models. Test Generation.

★ ★ ★ ★ ★

1.55k views • 154 slides
Chapter 4

Chapter 4

Chapter 4. Test Generation. What is this chapter about?. Introduce the basic concepts of ATPG Focus on a number of combinational and sequential ATPG techniques Deterministic ATPG and simulation-based ATPG Fast untestable fault identification ATPG for various fault models. Test Generation.

★ ★ ★ ★ ★

1.65k views • 133 slides
Recent Work, in Two Acts Carlos Pacheco 8/15/2008 Agenda

Recent Work, in Two Acts Carlos Pacheco 8/15/2008 Agenda

Recent Work, in Two Acts Carlos Pacheco 8/15/2008 Agenda. Deconstructing Randoop Mutation-based test generation. Deconstructing Randoop. deconstruct. verb [trans.]

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650 views • 47 slides
Saturation effect and the need for a new theory of software reliability

Saturation effect and the need for a new theory of software reliability

Saturation effect and the need for a new theory of software reliability. Aditya P. Mathur Professor, Department of Computer Science, Associate Dean, Graduate Education and International Programs Purdue University. Department of Computer Science North Dakota State University, Fargo, ND

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320 views • 23 slides
Paper Report

Paper Report

Paper Report. Design Fault Directed Test Generation for Microprocessor Validation. Deepak A. Mathaikutty , Sandeep K. Shukla FERMAT Lab, Virginia Tech, Blacksburg Sreekumar V. Kodakara , David Lilja The University of Minnesota, Minneapolis Ajit Dingankar

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304 views • 22 slides
Functional and Timing Validation of Partially Bypassed Processor Pipelines

Functional and Timing Validation of Partially Bypassed Processor Pipelines

Functional and Timing Validation of Partially Bypassed Processor Pipelines. *Qiang Zhu Fujitsu Laboratories LTD. Japan. Aviral Shrivastava Computer Science and Engineering, ASU, Tempe, USA. Nikil Dutt Information and Computer Science, UC Irvine, USA. Processor Bypasses. RF. X2. F. D.

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277 views • 17 slides
RUGE

RUGE

RUGE. Open Source framework for random testing. Brendan McCarthy DevClear Oct 1, 2013. What is RUGE. New OSS framework Generates and runs integration/system tests When manually-crafted testing hits the wall D iminishing returns The more tests, the more costly are changes

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257 views • 11 slides

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