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CMP238: Projeto e Teste de Sistemas VLSI

CMP238: Projeto e Teste de Sistemas VLSI

CMP238: Projeto e Teste de Sistemas VLSI. Marcelo Lubaszewski Aula 1 - Teste PPGC - UFRGS 2005/I. Lecture 2 - Fault Modeling. Defects, Errors, and Faults Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence

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684 views • 58 slides
EE434: ASIC and Digital Systems

EE434: ASIC and Digital Systems

EE434: ASIC and Digital Systems. Midterm 2 Review Jacob Murray School of EECS, WSU jmurray@eecs.wsu.edu. Structure of the Exam. Three problems with multiple parts All topics will be almost equally represented Will look similar to layout of sample exam What is f air game?

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546 views • 41 slides
TSS@ETS10 Fault Models, Fault Simulation and Test Generation

TSS@ETS10 Fault Models, Fault Simulation and Test Generation

TSS@ETS10 Fault Models, Fault Simulation and Test Generation. Vishwani D. Agrawal Department of ECE, Auburn University Auburn, AL 36849, USA www.ece.auburn.edu/~vagrawal vagrawal@eng.auburn.edu Prague, May 22, 2010, 2:30-6:30PM. Fault Modeling. Why model faults?

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247 views • 23 slides
VLSI Testing Lecture 3: Fault Modeling

VLSI Testing Lecture 3: Fault Modeling

VLSI Testing Lecture 3: Fault Modeling. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 19, 2013, 2:30-3:30PM. Contents.

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908 views • 22 slides
Lecture 5 Fault Modeling

Lecture 5 Fault Modeling

Lecture 5 Fault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at faults and multiple faults Transistor faults Summary Review exercise.

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268 views • 22 slides
VLSI Testing Lecture 3: Fault Modeling

VLSI Testing Lecture 3: Fault Modeling

VLSI Testing Lecture 3: Fault Modeling. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 25, 2012, 3:00-4:00PM. Contents.

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342 views • 22 slides
VLSI Testing Lecture 3a: Fault Modeling

VLSI Testing Lecture 3a: Fault Modeling

VLSI Testing Lecture 3a: Fault Modeling. Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at faults and multiple faults Transistor faults Summary.

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226 views • 21 slides

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