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Lecture 15 Memory Test

Lecture 15 Memory Test

Lecture 15 Memory Test. Memory market and memory complexity Notation Faults and failures MATS+ March Test Memory fault models March test algorithms Inductive fault analysis Summary. Density and Defect Trends. 1970 -- DRAM Invention (Intel) 1024 bits 1993 -- 1st 256 MBit DRAM papers

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975 views • 65 slides
Lecture 25 Built-In Self-Testing Pattern Generation and Response Compaction

Lecture 25 Built-In Self-Testing Pattern Generation and Response Compaction

Lecture 25 Built-In Self-Testing Pattern Generation and Response Compaction. Motivation and economics Definitions Built-in self-testing (BIST) process BIST pattern generation (PG) BIST response compaction (RC) Aliasing probability Example Summary. BIST Motivation.

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1.3k views • 59 slides
Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions Summary. Motivation for Standard. Bed-of-nails printed circuit board tester gone

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934 views • 32 slides
Lecture 31 System Test

Lecture 31 System Test

Lecture 31 System Test Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary A System and Its Testing

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713 views • 22 slides
Lecture 31 System Test

Lecture 31 System Test

Lecture 31 System Test. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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465 views • 22 slides
Lecture 31 System Test

Lecture 31 System Test

Lecture 31 System Test. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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381 views • 22 slides
Lecture 13 Sequential Circuit ATPG Time-Frame Expansion

Lecture 13 Sequential Circuit ATPG Time-Frame Expansion

Lecture 13 Sequential Circuit ATPG Time-Frame Expansion. Problem of sequential circuit ATPG Time-frame expansion Nine-valued logic ATPG implementation and drivability Complexity of ATPG Cycle-free and cyclic circuits Asynchronous circuits Summary. Sequential Circuits.

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341 views • 22 slides
Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan & Description Language (BSDL)

Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan & Description Language (BSDL)

Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan & Description Language (BSDL). Special scan cells and pins Cell timing / wiring constraints Cell delay measurements Boundary Scan Description Language Summary. Observe-Only Scan Cell. Control & Observe Scan Cell. Bidirectional Pins.

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345 views • 21 slides

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