'Traditional ic production test' presentation slideshows

Embedded Fault Diagnosis for Digital Logic Exploiting Regularity

Embedded Fault Diagnosis for Digital Logic Exploiting Regularity. R. Kothe , H. T. Vierhaus. Brandenburg University of Technology Cottbus. Computer Science Department. Computer Engineering Group. Outline. Introduction: Fault Diagnosis - when and what for? Scan Test and Pattern Compaction

536 views • 43 slides