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Dynamic Power Noise Analysis Method for Memory Designs

Dynamic Power Noise Analysis Method for Memory Designs. Chanseok Hwang , Changwoo Kang, Bosun Hwang Joonho Choi, Moonhyun Yoo CAE Team, Semiconductor Research Center Samsung Electronics. Outline. Memory Design Overview Memory Core Operations Our approach Memory Core Circuit Modeling

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Dynamic Power Noise Analysis Method for Memory Designs

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  1. Dynamic Power Noise Analysis Method for Memory Designs Chanseok Hwang, Changwoo Kang, Bosun Hwang Joonho Choi, Moonhyun Yoo CAE Team, Semiconductor Research Center Samsung Electronics

  2. Outline • Memory Design Overview • Memory Core Operations • Our approach • Memory Core Circuit Modeling • Power Grid Creation and Reduction • Simulation Results • Conclusions

  3. Memory Design Overview • Power noise increasingly affects circuit robustness • Low VDD (< 1.0V), High Speed (>2GHz) • Challenges in power noise analysis • Modeling of huge power network • Long simulation times An Example of DRAM Fullchip Power Grid

  4. DRAM Core Operations • Core AC parameters : Sensing/Restore Time • Highly sensitive to power noises : Voltage margin and Operation speed VDD VCELL LAB VCELL = 1.125(90% VDD) VBL WL VBL=500mv BL LAB BLB Sensing time VSS LA Restore time Simulation waveforms of sensing operation Sense amplifiers with power networks

  5. Our Approach • Current Source Model (CSM) • Core sub-array block is replaced by a current source • Multi-banks operation can be simulated • Power Network Generation & Reduction • Memory core power network is generated automatically • MOR technique is adopted efficiently

  6. A C E G Active WL Block with active WL B D F H Active blocks become current sources Block with inactive WL SA SA SWD SWD Conj Conj Fullchip with 8 Banks Core Bank Sub-Array Block Inactive blocks become decoupling caps Hierarchical Memory Core Structure Current Source Modeling

  7. A C E G B D F H Multiple-Bank Operations Activate Bank H Activate Bank F A C E G A C E G 7ns B D F H B D F H Activate Bank B, C, F, G Activate Bank A, D, E, H A C E G 10ns B D F H : current sources : circuits

  8. Our Approach • Current Source Model (CSM) • Core sub-array block is replaced by a current source • Multiple-Bank Operation Modeling • Power Network Generation & Reduction • Memory core power network is generated automatically in early design stages • MOR technique is adopted efficiently

  9. Coarse Grid Coarse Grid Coarse Grid Fine Grid Power Network Generation & Reduction Automatically Generated Power Network amp amp amp amp pad amp amp amp amp amp amp Power Network Generation GUI Reduced Power Network

  10. A C E G B D F H Power Noise Verification Flow Active Circuits Current Sources + Power Network Creation Simulation Waveform Circuit connection to power network Circuit Simulation Voltage Drop Map Viewer Verification Fail

  11. Simulation Results • Example Circuit: 1G DRAM • Sensing & Restore Time Comparisons • Simulation Time and Accuracy for the Proposed Power Network Model • Single Bank vs. Multiple Bank Operations

  12. Results: Analysis of different power networks • Run-Time: 15.3X reduction • Accuracy Error:1% in Sensing, 8% in Restore time

  13. Simulation Results • We could get this results by using the proposed method.

  14. Conclusions • Current Source-based Model is proposed for the power noise analysis of memory circuits. • Based on the hierarchical memory core array structure • The method of automatic generation and reduction of power networks at design early stage is suggested. • In Simulation Results: 1G DRAM • Simulation time reduction > 15X • Analysis error < 8% • Due to the reduced complexity the simulation of multiple-bank operations was possible.

  15. Thank You!

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