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NeSSI AND ANALYZERS. ISSUES AND DISCUSSION REGARDING THE SAM CONCEPT FROM THE ANALYZER SUPPLIERS PERSPECTIVE. NESSI GENERATION I. LIMITED PASSIVE COMPONENTS LIMITED ACTIVE / SENSOR COMPONENTS VIRTUALLY NO SMART COMPONENTS. COMPONENTS BASED ON SEMICONDUCTOR AVAILABILITY
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NeSSI AND ANALYZERS ISSUES AND DISCUSSION REGARDING THE SAM CONCEPT FROM THE ANALYZER SUPPLIERS PERSPECTIVE
NESSI GENERATION I • LIMITED PASSIVE COMPONENTS • LIMITED ACTIVE / SENSOR COMPONENTS • VIRTUALLY NO SMART COMPONENTS
COMPONENTS BASED ON SEMICONDUCTOR AVAILABILITY GENERAL PURPOSE PREMIUM $ PURE GASES LIQUID SERVICE COMPATIBILITY SENSOR I/O GENERALLY LIMITED TO ANALOG HARDWARE WHERE HAZARDOUS AREA CLASS IS APPLICABLE PRESSURE XMITTER TEMPERATURE XMITTER FLOW XMITTER NeSSI GENERATION I
NeSSI GENERATION I • AT-LINE VAPOR SAMPLE VALIDATION SYSTEM • SOLID SUBSTRATE • SEMICON COMPONENTS • INDUSTRIAL SENSORS • ANALOG • LIBERTIES TAKEN - DIV 2
NeSSI GENERATION II • INDUSTRIAL - CENTRIC COMPONENTS NOW AVAILABLE AND NUMBERS GROWING • MODULAR SUBSTRATES • DISCUSSION OF BUS BASED SENSORS • CONCEPTS ON SENSOR INTELLIGENCE BEING DEVELOPED • INTERFACE? HOW? WHERE? WHY? WHEN?
NeSSI GENERATION II • SAM • DEVICENET / SDS / OTHERS • ETHERNET IP • INDUSTRIAL GRADE • HAZARDOUS LOCATION - ZONE/DIVISION I • HEATING • ELECTRO / MECHANICAL DEVICES
NeSSI GENERATION II • HOW? • AT THE GII LEVEL, FLEXIBILITY WILL BE THE KEY • AVAILABLE SENSORS MAY BE MIXED MODE • ANALOG HAZARDOUS LOCATION • ANALOG I.S. • DEVICENET • CAN OPEN
NeSSI GENERATION II • HOW? • THE SAM WILL LIKELY NEED CAPABLE OF INTERFACING MIXED MODE SENSORS INTO ANY CUSTOMER COMMUNICATION PROTOCOL TRANSMITTED TO NUMEROUS HMI DEVICES AND DISTRIBUTED CONTROL SYSTEM PROTOCOLS
NeSSI GENERATION II • WHERE? • LOCAL INTERFACE FOR TROUBLESHOOTING • REMOTE FOR MONITORING AND DATA ARCHIVAL
NeSSI GENERATION II • WHY? • TO MONITOR SHS FUNCTION • TO ARCHIVE SHS OPERATIONAL DATA • TO ADJUST SHS ACTIVE SENSORS IF APPLICABLE
NeSSI GENERATION II • WHY? • MAINTAINABILITY • MAINTENANCE EFFICIENCY • PROVE THE TECHNOLOGY • STUDY COST TO BENEFIT ISSUES
NeSSI GENERATIONS II & III • ANALYZER TYPES • TRANSMITTER / SENSOR • SIMPLE ANALYSIS • HIGHER LEVEL
NeSSI GENERATIONS II & III • ANALYZER INTEGRATION • Most transmitter and simple analyzers do not feature the horsepower to support external SAM issues • Higher level analyzers are manufacturer optimized for their primary goal - providing a solid compositional measurement • This is a market driven definition
NeSSI GENERATIONS II & III • Addition of a flexible sensor interface to the higher level analyzer will mean $$$$ • Sample systems have personalities • Additional Hardware = Additional Space
NeSSI GENERATION II & III • I/O is already on the market • I/O already has a developed base • I/O offers the flexibility on INPUT and OUTPUT requirements for our customers • I/O can meet the requirements for the area in which it is installed • I/O can offer intelligence for active sensors via single loop controllers where needed
NeSSI GENERATION II & III • From the analyzer manufacturers perspective, the market will need to prove the cost to benefit issues regarding internal flexible I/O and control • Reinvent the wheel? • The solution needs to be engineered on the basis of the goal: Data • Future? Control… Intelligence… Reliability!