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IMMITTANCE SPECTROSCOPY Models, data fitting, and analysis. J. Ross Macdonald IMSPEMAS Workshop Warsaw 9/2003 . MATERIAL/ELECTRODE CHARACTERIZATION WITH IS. Bulk resistivity and dispersion Bulk dielectric constant Mobile charge concentrations Mobilities and valence numbers
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IMMITTANCE SPECTROSCOPYModels, data fitting, and analysis J. Ross Macdonald IMSPEMAS Workshop Warsaw 9/2003
MATERIAL/ELECTRODE CHARACTERIZATION WITH IS • Bulk resistivity and dispersion • Bulk dielectric constant • Mobile charge concentrations • Mobilities and valence numbers • Bulk dissociation and recombination rates • Electrode reaction rate constant • Electrode adsorption rate constant • Other fit-model parameters
IMMITTANCE SPECTROSCOPY • Impedance Spectroscopy • Dielectric Spectroscopy • Data Analysis • CNLS; INVERSION • LEVM ---- LEVMW V. 8
CNLS-LEVM-LEVMW • CNLS: Complex nonlinear least squares fitting. Fit complex data to a model whose parts satisfy the Kronig-Kramers transform relations • LEVMW: Windows version of LEVM, a free general CNLS fitting and inversion program. Download it and its manual from http://www.physics.unc.edu/~macd/ • LEVMW can accurately fit data to K0, K1, and many other models. It allows temporal response to be calculated from frequency response and vice versa
CONCLUSIONS • The Moynihan original modulus formalism dispersion model is theoretically and experimentally incorrect and should be replaced by the corrected modulus formalism. • The corrected modulus formalism isisomorphic to the Scher-Lax microscopic model and leads to virtually independent of temperature and ionic concentration.
The variable-correlation assumption of the OMF and NCM is unsupported by fits of experimental data using the CK1 CMF model. • The cutoff model is much superior to all coupling models and requires no ad hoc assumptions. • Nearly-constant-loss behavior is likely to be associated with coupling between vibrating ions and induced dipoles of the bulk material. A microscopic model of the process is needed.