1 / 18

Characterization Techniques used in the Study of Graphene

Characterization Techniques used in the Study of Graphene. by Robert Herrick at the NanoTech User Facility. Overview. A History of the NanoTech User Facility A History of Graphene and goals for the study What is a Hall Bar? Characterization tools: Raman, AFM, Ellipsometer.

ted
Download Presentation

Characterization Techniques used in the Study of Graphene

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Characterization Techniques used in the Study of Graphene by Robert Herrick at the NanoTech User Facility

  2. Overview • A History of the NanoTech User Facility • A History of Graphene and goals for the study • What is a Hall Bar? • Characterization tools: Raman, AFM, Ellipsometer

  3. NTUF houses instruments for Nanoscale Characterization • Established in 1998 for community access to advanced lab equipment • In 2004, became 1 of 13 nodes of the NSF sponsored NNIN • National Nanotechnology Infrastructure Network • 3,000 sq ft lab in the Molecular Engineering & Sciences Building • Operates jointly with the College of Engineering's Micro Fabrication Facility • Has PhD. level trainers and lab scientists https://depts.washington.edu/ntuf/facility/index.php

  4. Graphene a Carbon Allotrope • 2-d honeycomb lattice structure (1.4Å bond length, 3.4Å step height) • A double bond gives it high electron mobility(*3 >15kcm²/Vs @ room temp) • Strongest material ever tested 200 X as strong as steel (*4 Young’s modulus >0.5–1 TPa, Tensile strength ~130 Gpa) • Current density: 106 times that of copper, at room temperature*4 • Thermal conductivity: outperforming diamond (~5 103 W/mK, ) *4

  5. The Hall Bar • The Hall Effect • The Lorentz force • The Right Hand Rule • Can Measure the electron, hole mobility/density. 1 1 Image courtesy of http://en.wikipedia.org/wiki/Hall_effect

  6. Characterization Techniques • Raman spectroscopy • Atomic force microscopy • Ellipsometry

  7. Raman Microscopy • Raman scattered photons lose or gain energy during the scattering process • Vibrational info is specific to the chemical bonds and symmetry of molecules • Normal energy range: 200 - 4000 cm–1 • Symmetric=Raman active, Asymmetric=IR active *5 & *6

  8. Renishaw inVia Raman Microscope • Wire 2.0 software with mapping ability • Leica DMIRBE inverted optical microscope • 10X, 50X, and 100X Objectives • Motorized X,Y,Z stage controls • Dual laser excitation sources at 514 nm and 785 nm • inVia Spectrometer • CCD camera

  9. Renishaw Raman Results

  10. Atomic Force Microscopy • a form of Scanning Probe Microcopy • is limited to surface topography • in fluids or in air under ambient conditions • achieves resolutions of 10 pm • 1 nanoNewton of force per angstrom • in Dynamic/ tapping mode the feedback loop attempts to maintain a constant frequency • in Static/ contact mode the feedback loop attempts to maintain deflection of tip *2 Image from “Window on a Small World” by Nancy K. McGuire Today’s Chemist at Work June 2002

  11. Dimension 3100 Atomic Force Microscope Hybrid XYZ Scanner: • Scan range (XY) 90 μm x 90 μm • Vertical range (Z) 7.5 μm Image resolution: • Up to 4096 points per scan line and 1024 lines Hardware: • NanoScope IVa controller • Dimension Hybrid XYZ scanner • Motorized sample stage (resolution: 2 μm) • Stage box w/ vacuum pump and illuminator • Integrated video optics • Motorized optical focus/zoom • Vibration isolation table *3 https://depts.washington.edu/ntuf/facility/docs/Dimension_Datasheet.pdf

  12. A.F.M. RESULTS Measured step heights in the range of 10’s of nm No clean or usable Graphene measured

  13. Ellipsometry

  14. J.A.Woollam M2000XL Ellipsometer Specifications: Spectral range 210-1700nm Scan speed < 10 s for entire range Spot size > 1.5 mm, focused <150 µm Mapping up to 150X150 mm Automatic sample alignment Imaging via integrated CCD camera Temperature range 20 - 300 *C

  15. Ellipsometer Results

  16. Characterization of Failed Experiment *1

  17. Acknowledgements • North Seattle Community College • Alissa Agnello, Peter Kazarinoff • The NanoTecnology User Facility • Steven Hsieh, Arin Greenwood, Jeremiah Williams, Lindsey Maier, Paul Wallace, Xiaodong Xu, Scott Braswell and Alec Pakhomov • The University of Washington • The National Science Foundation • The National Nanotechnology Infrastructure Network

  18. Citations *1 Steven Hsieh, Arin Greenwood, Jeremiah Williams, Lindsey Maier, Paul Wallace, Xiaodong Xu, Scott Braswell and Alec Pakhomov *2Image from “Window on a Small World” by Nancy K. McGuire Today’s Chemist at Work June 2002 *3 https://depts.washington.edu/ntuf/facility/docs/Dimension_Datasheet.pdf *4 Graphene the new Wonder Material, Mitali Kakran, Nanyang Technological University, SINGAPORE *5 http://www.doitpoms.ac.uk/tlplib/raman/raman_scattering.php *6 https://depts.washington.edu/ntuf/facility/docs/ramanschematic.pdf

More Related