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SPM studies of Electromagnetic Properties of Graphene. Daniel C. Ralph, Cornell University, ECCS 0335765.
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SPM studies of Electromagnetic Properties of Graphene Daniel C. Ralph, Cornell University, ECCS 0335765 Graphene is a 2-dimensional atomically flat hexagonal lattice of carbon that has excellent mechanical electrical and optical properties, however it’s unique bandstructure makes it impractical for certain applications. Therefore, it is sometimes necessary to modify grapheneproperties in a controllable manner. One method of modification to enhance the properties of graphene is to pattern the surface of the graphene. In this study graphene flakes are prepared by mechanical exfoliation on Si/SiO2 substrates are characterized using scanning probe microscopy tools. Selected samples are studied before and after modification by Scanning Probe Microscopy tools and optical microscopy or spectroscopy. Single, double, and triple layered graphene sampleswere tested. Topological features of the graphene and their electromagnetic properties were tested via atomic force microscopy Methods at the NRF. Topographical image of Graphene. John Cavin and Dr. Irma Kuljanishvili, Saint Louis University Work performed at Washington University in St. Louis Nano Research Facility Two line profiles show steps representing additional graphene layers. Black line corresponds to line 1 in topographical image. Red line corresponds to line 2 in topographical image.