220 likes | 413 Views
Integrated Process Capability Analysis Model (IPCAM) for a Product with Multiple Quality Characteristics. 報告人 : 游崑慈. Outlines. Supply chain management Process capability indices Taguchi loss function Process yield & Six-sigma IPCAM Future applications. Transfer. Transfer. Transfer.
E N D
Integrated Process Capability Analysis Model (IPCAM)for a Product with Multiple Quality Characteristics 報告人:游崑慈
Outlines • Supply chain management • Process capability indices • Taguchi loss function • Process yield & Six-sigma • IPCAM • Future applications
Transfer Transfer Transfer Transfer Supply chain management INFORMATION FLOW Supplier Distribution Retail Outlet Consumer Manufacturing CASH FLOW
LSL LSL USL USL m d m d Process distribution Process distribution 製造業通常透過統計製程管制(SPC)來監控與改善產品品質,使製程變異降低進而達到穩定狀態,當製程穩定後,品管工程師想進一步了解產品符合規格的能力,或出現不良品的比率有多少?
Nominal-the-best Process Capability Index 製程能力指標(PCI)便是用來衡量製程符合規格的能力,與結合製程參數與製程規格(LSL,T,USL)的函數,能夠表示製程中心偏移與製程變異程度,因此常被用來評估供應商是否有能力製作出符合產品規格的一種量數,並作為購買契約上買賣雙方對品質要求的依據以及工廠內部持續改善品質的參考。 T LSL USL Yield% 2Φ(3Cpm) - 1 m d Process distribution
Loss function Taguchi loss function Japan U.S.A T USL LSL
μB • Yield% = F(3Cpu) 2F(3Cpu) - 1 Smaller-the-better Process Capability Index • Cpu= • Quality characteristics : • roughness, noise, waiting time, • thickness.
Yield% = F(3Cpl) 2F(3Cpl) – 1 Larger -the-better Process Capability Index • Cpl = • Quality characteristics : • Life-span、hardness、 • pulling force、resolution.
Process Yield • %Yield = 2Φ(3Cpu) – 1 • %Yield = 2Φ(3Cpl) – 1 • %Yield 2Φ(3Cpm) - 1 • PCI↗ process yield↗ • process loss ↘
若 則稱此製程具有 6-sigma quality level。 Six Sigma 假設品質特性符合Normal distribution L=88 T=100 U=112
99.73% Six-sigma process concept Normal distribution centered Spec. Limit Percent Defective PPM 68.27 317300 95.45 45500 99.73 2700 99.9937 63 99.999943 0.57 99.9999998 0.002 8
is distributed as , where Estimations • One -side capability indices (UMVUE) i {u, l }
Cpl : represent axes X (larger-the-better) Cpu : represent axes Y (smaller-the-better) Cpm : represent XY plane (nominal-the-best)
Estimations • Two-side capability index It is a more complicated distribution, we often used the mathematical software to do numerical Analysis.
Hypothesis test for one-side quality specification • H0: Cpi • H1: Cpi where i {u, l}. The critical regions are CS = { | S0} and the critical value S0 is determined by s0 | Cpi ) = Pr ( .
Hypothesis test for two-side quality specification • H0: Cpm • H1: Cpm Pr ( m0 | Cpm ) =
m0=1.911 S0=1.899 S0=1.899
Future Applications • Technical education quality management model • Medical service quality control • Human resources management