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Bruker IRIS TERS-Enabled AFM-Raman Systems. Seamless Integration of Atomic Force Microscopy and Raman Spectroscopy. Easy-to-Use AFMs for Spectroscopy in Materials & Life Sciences Highest Performance, Most Complete AFM Capabilities TERS-Ready AFM-Raman Integration
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Bruker IRISTERS-Enabled AFM-Raman Systems Seamless Integration of Atomic Force Microscopy and Raman Spectroscopy • Easy-to-Use AFMs for Spectroscopy in Materials & Life Sciences • Highest Performance, Most Complete AFM Capabilities • TERS-Ready AFM-Raman Integration • True Nanoscale Spectroscopy Targeted to Your Application IRIS = Integrated AFM-Raman Imaging System September 3, 2014 Bruker IRIS 1
The Innova-IRIS-inVia System Efficient direct optical coupling Bruker Innova-IRIS AFM Flexible sampling arm Renishaw inVia Raman microscope Bruker Nano Surfaces – Renishaw 2
TERS DataMalachite Green STM results Tip in feedback Tip retracted 50 nm Tip retracted 100 nm Data acquired using Innova-IRIS-inVia system Bruker Nano Surfaces – Renishaw 3
Tailored SolutionsAFM-Raman SystemsFor Your Application Catalyst™-IRIS based systems for transparent samples With Renishaw InVia With Horiba XploRA INV Prof. A. Balter, Physics Department UMK, Toruń, Poland September 3, 2014 Bruker IRIS 4