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Industrial challenges and trends in terrestrial single-event effects (SEE)

Industrial challenges and trends in terrestrial single-event effects (SEE) . Dr. Robert Baumann TI/IEEE Fellow, Technology Office Aerospace & Defense (MHRS Group) High Performance Analog Products Texas Instruments, Dallas, Texas, USA. Natural

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Industrial challenges and trends in terrestrial single-event effects (SEE)

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  1. Industrial challenges and trends in terrestrial single-event effects (SEE) Dr. Robert Baumann TI/IEEE Fellow, Technology Office Aerospace & Defense (MHRS Group) High Performance Analog Products Texas Instruments, Dallas, Texas, USA

  2. Natural Terrestrial Background (neutrons and a particles) Avionics (neutrons) Space (protons, heavy ions, electrons) Man-made Accelerators/Nuclear reactors (x-ray, gamma, proton, neutron, etc.) Weapons (x-ray, gamma, neutrons) Industrial/Security (x-ray, gamma, e-beam) Medical (x-ray, gamma, protons, neutrons, e-beam) Radiation Environments

  3. Flux, Total Ionizing Dose, and Neutron/Proton Dose Comparison Adapted from M. Brugger (CERN)

  4. Energetic Ions in Matter Silicon surface Generated with SRIM 2008 Generated with SRIM 2008 27 um 5 MeV He in Silicon

  5. Transient Charge Generation Charge Trapping/Interface Damage Nuclear Reactions Structural (Lattice) Damage Physical Manifestations of Radiation Single Event Effects Dose Effects chronic stochastic Dose Rate Effects

  6. Basic Reliability Definitions Hard Failure (GOI, EM, NBTI, ESD,…TID, ND, SEE) An error induced by faulty device operation. DATA is lost AND function is lost and can no longer operate at that location. Soft Failure (glitch, noise, SEE) An event corrupting only the DATA stored in a device. The device itself is not damaged and functionality is restored when new data is written. 1 FIT is 1 failure in 114,155 years! or 1,000,000 FIT is ~ 1 failure/month

  7. Who cares about SEE (SEU, SEL)? Don’t Care Really Care • Consumer Goods • Single-chip • Non-critical • Cell phones • MP3 Players • High Reliability • Multi-chip systems • Life support • Safety systems • Medical electronics • Automotive, Avionics Catalog DSP, MSP, MCUs etc. < 1 kFIT/Chip (~ 1 fail/114 yrs) 1 MFIT/chip ok (~1 fail/month)

  8. BIG Business Impact Loss of customer confidence Loss of revenue = Sun Screen Daniel Lyons, Forbes Global, 11.13.00 mysterious glitch has been popping up since late last year… for America Online, Ebay and dozens of other major corporateaccounts…The SUN (server) has caused crashes at dozens of customer sites. An odd problem involving stray cosmic rays and memory chipsin the flagship Enterprise server line… A dotcom company bought a Sun 6500 server to run…the core of its business. The server crashed and rebooted four times over a few months. "It's ridiculous. I've got a $300,000 server that doesn't work. The thing should be bulletproof," says the company's president.

  9. Safety Impact: QANTAS Flight 72 “In-flight upset, 154 km west of Learmonth, WA, 7 Oct. 2008, VH-QPA Airbus A330-303,” ATSB Transp. Safety Report - Aviation Occurrence Invest., AO-2008-070, pp. 1 – 313, Dec. 2011. Single subatomic event has human-scale impact!

  10. Terrestrial + Avionics Environments Alpha particles and neutrons

  11. Actual & Simulated alpha spectra 238U 232Th Measured Thick 232Th Package-simulation U:Th (50:50)

  12. Alpha Particles from Materials • Distributed throughout materials • Flux depends on types of materials & purity • Most of the alphas are from packaging • Ultra low alpha materials < 0.002 a/cm2-hr

  13. Cosmic Cascade Single Incoming Cosmic Particle po N J. F. Ziegler, “Terrestrial Cosmic Ray Intensities,” IBM J. Res. Develop., Vol. 42(1), p. 125, Jan. 1998. p± g P p+ g m± e+ e- p- e- g g m- e± m+ m+ m- m+

  14. Effect of Altitude/Latitude 6.0 Adapted from Eugene Normand, “Single Event Effects in Avionics”, IEEE Trans. Nucl. Sci., 43(2), April 1996, pp. 463. North Flight altitudes 400 5.0 . 350 G.A. Glatzmaier and P.H. Roberts, "Rotation and magnetism of Earth's inner core," Science, 274, 1887-1891 (1996). 300 4.0 250 Terrestrial Altitudes Relative Neutron Flux (sea-level=1) 3.0 Relative Neutron Flux 200 Sea-level 150 2.0 100 Flight Altitudes 1.0 50 South equatorial polar 0 0.0 25 0 5 10 15 20 Altitude (km) 0 10 20 30 40 50 60 70 80 90 at 3,000 meters relative neutron flux ~ 11x higher than sea-level Latitude (degrees)

  15. 10B and Thermal Neutrons 104 103 102 snth (barns) 101 100 Oxygen Boron-11 BORON 10 10-1 Phosphorus Tungsten Aluminum Nitrogen Titanium Arsenic Copper Silicon 10-2 10-3 Thermal neutron Generated with SRIM 7Li 10B 0.84 MeV 4He 1.47 MeV R. Baumann, T. Hossain, E. Smith, S. Murata, H. Kitagawa, “Boron as a primary source of radiation in high density DRAMs”, IEEE Symp. VLSI Tech., June 1995, pp. 81 - 82

  16. Single Event Effects (SEEs) A single event (nuclear reaction or energetic ion) creates transient charge that induces a disruption in circuit operation or data state.Typically SEE are very rare events (1 per month, etc.)Of all possible nuclear events only a fraction can cause a SEEOf all possible SEE only a few will cause machine state failures (derating effects)

  17. SEU and SEL – Most Common SEE +V V Ion Track Ion Track n+ diffusion p- epi Electron collection Potential Contour Deformation Drift Collection Electron-Hole Pairs Diffusion Collection Recombination Parasitic bipolar action Reverse-biased N+/P junction Single Event Upset Single Event Latch Up

  18. SRAM/DRAM Bit SEU Scaling Trend Planar DRAM sensitivity has been decreasing with scaling R. H. Edwards, C. S. Dyer, E. Normand, “Technical standard for atmospheric radiation single event effects, (SEE) on avionics electronics”, IEEE Rad. Effects Data Workshop, 2004, pp. 1 - 5 Magnitudes from two different curves cannot be compared as these curves were individually normalized! FINFET SRAM sensitivity has been decreasing with scaling (since the 130nm node)

  19. Future Terrestrial Mechanisms? From B. Sierawski et al., “Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions”, IEEE Trans. NS, 56 (6), Part 1, Dec. 2009, pp. 3085 - 3092 (with TI) Adapted from B. Sierawski et al., “Effects of Scaling on Muon-Induced Soft Errors”, 2011 IEEE IRPS, pp. 3C.3.1 - 3C.3.6. (with TI) Proton SEU MuonSEU s for direct ionization s for prior technologies n + a SER When Qcritreaches 0.2 fC SER will double from muons alone and at 0.1 fC SER will be 5-10x higher. Note: Qcrit for 40nm is ~ 0.5 fC Terrestrial Protons may also dominate as Qcrit is reduced due to the much higher cross-section for direct ionization.

  20. Accelerated Testing & Facilities

  21. Extrapolating Neutron Results NYC Sea-level = 13 n/hr/cm2 Actual neutron particle flux (≥ 10MeV n/hr/cm2) reaching the Si as defined by JEDEC JESD89A Failure rate due to neutrons (errors/hr) always induce > 100 upsets per test so that s≤ 10%) Neutron beam Conversion of TTL ULC from U238 foil to actual n/hr-cm2 (≥ 10MeV) Neutron Sensitivity (errors/neutron/cm2) sources are inexpensive and in-house BUT extrapolating the alpha-particle SEE is much more difficult and requires simulation nASER Test

  22. Accelerated Neutron Testing 1E-02 1E-03 1E-04 Neutrons/cm2-sec-MeV 1E-05 1E-06 WNR Beam / 1.38E08 Atmosphere 1E-07 1 10 100 1000 Neutron Energy (MeV) neutron test procedure in JESD89 and JESD89A Proton beam master shutter Tungsten spallation target Fission Foil DUT shutter Neutron beams Close match between terrestrial background spectrum and Los Alamos means extrapolation is based on a simple multiplication 30ºL 30ºR 15ºR 0º 15ºL

  23. “Atmospheric” Neutron Test Facilities From Charlie Slayman, “Theoretical Correlation of Broad Spectrum Neutron Sources for Accelerated Soft Error Testing”, IEEE Nuclear and Space Radiation Effects Conference (NSREC), Denver, July 22, 2010 (to be published Trans. on Nuc. Sci. December 2010) • Svedberg Laboratory, Uppsala University, Sweden (TSL, ANITA) • Los Alamos Neutron Science Center - Ice House (LANSCE), New Mexico, USA • Tri-University Meson Facility - Univ. of British Columbia (TRIUMF) • Research Center for Nuclear Physics - Osaka University (RCNP) • VesuvioBeamline- Rutherford Appleton Lab, Oxfordshire, UK (ISIS) • JEDEC JESD89A “standard” flux x (3x108) Extend En > 800MeV Need for muon testing will grow

  24. Summary • SEE sensitivity is decreasing with new generations due to Vdd saturation, HOWEVER increased bit density leads to similar or increasing system SER. • Nano-devices may offer improved resilience against SEE (bulk/SOI FinFETs, etc.) but will NOT eliminate them. Protons and muons are a growing concern and 10B reactions with thermal neutrons can still be a risk. • SER is application-specificso one failure rate specification for all products is NOT viable (e.g. for catalog products). Extensive support for radiation effects engineers needed to extrapolate reliability in a wide variety of environments. • Vendors that ignore the soft error problem will end up paying for it in loss of customer confidence – leading to significant revenue and market share loss. • Control and detection electronics in accelerator facilities share many of the problems induced by terrestrial and avionics radiation environments (typically at much higher equivalent fluxes). • Use of space-grade or enhanced COTS may be required for many accelerator applications and/or fault-tolerant system design.

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