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Application of Diamond Sensors at FLASH

Application of Diamond Sensors at FLASH. M.-E. Castro- Carballo , H. Henschel , A. Ignatenko , W. Lange, O. Novgorodova , W. Lohmann , R. Schmidt, S. Schuwalow. DESY, Zeuthen June 29, 2009. Overview. FLASH overview Motivation for BHM placement BHM Outlook Sensors Test at PITZ

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Application of Diamond Sensors at FLASH

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  1. Application of Diamond Sensors at FLASH M.-E. Castro-Carballo, H. Henschel, A. Ignatenko, W. Lange, O. Novgorodova, W. Lohmann, R. Schmidt, S. Schuwalow DESY, Zeuthen June 29, 2009

  2. Overview FLASH overview Motivation for BHM placement BHM Outlook Sensors Test at PITZ Results Summary 2

  3. FLASH overview High-gain Free Electron Laser VUV and soft X-ray regime Self-Amplified Spontaneous Emission (SASE) mode 1GeV maximum electron beam energy Wavelength down to 6.5 nm 10 fs pulses Peak current 1-2 kA

  4. Motivation for BHM placement FLASH beam dump line Vacuum leak Dump Vacuum Section 2879mm 2879mm DIPOLE + Trim D6 (TDC) DUMP BPM9 Stripline BPM15 Button Chamber with pump port & bellow WINDOW with Ti-chamber SWEEPER RD13 (HSK) QUAD Q10 (QC) QUAD Q11 (QC) STEERER, H7  to bend plane (CV) New beam position diagnostic tools are needed 4

  5. Beam Halo Monitor Outlook Electron beam pipe Air BPM BHM sensors 5

  6. Sensors 1. pCVD diamond produced by Diamond Detectors Ltd. Dimensions 10×10×0.3 mm3 Metallization: 50/50/200 nm Ti/Pt/Au 2. Single crystal sapphire (Al2O3) produced by CRYSTAL GmbH Dimensions 10×10×0.3 mm3 Metallization: 50/50/200 nm Al/Ti/Au The sensors will be operated like solid-state ionizationchambers 6

  7. Test at PITZ pCVD diamond Dimensions 12×12×0.5 mm3 Metallization: 10×10 mm2 Ti/Pt/Au 3 m 25 m 0.5 m 45 m WS2 7

  8. Plan of measurements 1. Electromagnetic Impact (EMI) investigation Sensor without bias. Scan over different bunch charges at parking position; x-position scans at certain bunch intensity. 2. Signal size measurements Biased sensor in the beam center. Measurements of the signal size over bunch intensity at different bias voltages. Scans of the beam profile (focused and unfocused beam).

  9. Results No bias, x=-5mm No bias, parking position 100V bias voltage, parking position Bunch charge 100pC

  10. Beam profile on High2scr1 xRMS=3.36 mm yRMS=3.29 mm xRMS=0.93 mm yRMS=1.30 mm appr. position and dimensions of the diamond sensor Imain=295A Imain=345A

  11. Signal from the diamond sensor Signal Bunch train trigger Imain=295A Imain=345A 11

  12. Expected charge produced in diamond by 10 pC beam ~ 230 nC 1 a.u. ~ 1 nC

  13. Summary • 1. Tests with 1 pCVD diamond sensor were carried out at PITZ (Photo Injector Test facility Zeuthen). • 2. The diamond was operated in the bunch charge range 1 pC to 1 nC • 3. Clear dependence of the signal on the bunch charge was observed • 4. Beam profiles for defocused and focused beam were measured • 5. EMI signals for unbiased sensor were small in comparison with the signals from biased sensor • 6. 4 pCVD diamonds and 4 artificial sapphires will be operated in real accelerator conditions at FLASH

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