1 / 11

Get to the point!

Get to the point!. CD stamper. AlGaN/GaN quantum well waveguide. surface atoms on Si single crystal. polymer growth. AFM - atomic force microscopy. A 'new' view of structure (1986).

Albert_Lan
Download Presentation

Get to the point!

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Get to the point!

  2. CD stamper AlGaN/GaN quantum well waveguide surface atoms on Si single crystal polymer growth AFM - atomic force microscopy A 'new' view of structure (1986) See Vocabulary of Surface Crystallography, Journal of Applied Physics 35, 1306 (1964), by Elizabeth A. Wood

  3. laser diode photodiode mirror Si3N4tip sample AFM - atomic force microscopy How does the microscope work? Tip scans sample Up and down movement of tip recorded by position sensing photodiode

  4. laser diode photodiode mirror Si3N4tip sample AFM - atomic force microscopy How does the microscope work? Tip scans sample Up and down movement of tip recorded by position sensing photodiode

  5. laser diode photodiode mirror Si3N4tip sample AFM - atomic force microscopy How does the microscope work? Two modes of operation

  6. Tip: 5-20 nm radius, 10-25 m high, on 50-400 m cantilever beam AFM - atomic force microscopy How does the microscope work? Contact mode - short-range interactions (Å) - interatomic forces

  7. AFM - atomic force microscopy How does the microscope work? Contact mode - short-range interactions (Å) - interatomic forces Tip: 5-20 nm radius, 10-25 m high, on 50-400 m cantilever beam Cantilever: low stiffness - can't deform surface Tip contacts surface Tip scans surface: either tip or specimen moved by piezoelectric positioning system over x and y Detector system can measure deflections in nm range

  8. AFM - atomic force microscopy How does the microscope work? Contact mode - short-range interactions (Å) - interatomic forces Two ways - 'constant force' ……. feedback system moves tip in z direction to keep force constant 'constant height'……. no feedback system - usually used when surface roughness small higher scan speeds possible

  9. AFM - atomic force microscopy How does the microscope work? Tapping mode - long-range forces - van der Waals, electrostatic, magnetic Tip vibrates (105 Hz) close to specimen surface (50-150 Å) with amplitude 10-100 nm May at times lightly contact surface Suitable for soft materials

  10. Amplitude Tip height AFM - atomic force microscopy How does the microscope work? Tapping mode Tip vibrates (105 Hz) close to specimen surface (50-150 Å) with amplitude 10-100 nm May at times lightly contact surface When near or on surface, oscillation is damped - tip z position corrected so that vibration amplitude stays constant

  11. AFM - atomic force microscopy From force-distance plot, can get: range & magnitude of attractive & repulsive forces elastic modulus & adhesion energy

More Related