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ACTFEL Device Modeling via SPICE

ACTFEL Device Modeling via SPICE. J. P. Bender and J. F. Wager Department of Electrical and Computer Engineering Center for Advanced Materials Research Oregon State University Corvallis, Oregon 97731-3211 http://www.ece.orst.edu/~jfw. Organization:. Fowler-Nordheim Diode Model

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ACTFEL Device Modeling via SPICE

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  1. ACTFEL Device Modeling via SPICE • J. P. Bender and J. F. Wager • Department of Electrical and Computer Engineering • Center for Advanced Materials Research • Oregon State University • Corvallis, Oregon 97731-3211 • http://www.ece.orst.edu/~jfw

  2. Organization: • Fowler-Nordheim Diode Model • Double-sheet Charge Model

  3. Fowler-Nordheim Diode Model

  4. Fowler-Nordheim Diode model: Q-V

  5. Fowler-Nordheim Diode model: C-V

  6. Fowler-Nordheim model: Transient response

  7. Fowler-Nordheim model: Transferred Charge Curve Fowler-Nordheim Model Experimental Data

  8. FN Model Scaling with Varying Vmax

  9. Modified Fowler-Nordheim Diode Model

  10. Double-sheet Charge Model

  11. Two-sheet Charge Model Band Diagram

  12. Two-sheet Charge Model Equivalent Circuit

  13. Two-sheet Charge Model • 1. Emission Mechanisms • Field emission (pure tunneling) • Thermal emission • Trap-to-band impact ionization • 2. Charge Capture • The probability that an electron crossing a sheet of charge is captured depends on: • Electric field at the sheet • Occupancy of the sheet

  14. Two-sheet Charge Model Space Charge Creation via Field Emission

  15. Two-sheet Charge Model Space Charge Creation via Trap-band Impact Ionization

  16. Two-sheet Charge Model: Static Space Charge • Ionized traps are not allowed to refill • FB= 1.5 V (experimental value) • Bulk trap depth = 1.38 V

  17. Transferred Charge Capacitance Overshoot (Two-sheet charge model) Experimental Data Fowler-Nordheim Diode model

  18. Conclusions • Fowler-Norheim Diode • Simple yet accurate SPICE model for devices without space charge • Two-sheet Charge Model • Demonstrates mapping of device physics to SPICE • Large amounts of C-V overshoot in SPICE

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