Project Goals:

1. P10345 – TFT Noise Characterization PlatformMembers: Kendell Clark (EE), Stephen Marshall (EE), Carmen Parisi (EE), James Spoth (CE), Ryan Vaughn (ME)Faculty Advisor, Sponsor: Dr. Bowman (EE)Analog Devices Integrated Microsystems Laboratory, RIT What is 1/f Noise? • Project Goals: • Develop an automated low noise measurement platform in order to investigate the 1/f noise properties of Thin Film Transistors (TFTs) on glass. • Noise Measurement Challenges • All circuit components affect noise levels! • Need to make the system add less noise than the device under test • High-frequency radiated interference • Low-frequency coupling of noise (AC power) • Need to measure lots of transistors • Requires at least a partially automated system • Unwanted signal created by trapping electrons in transistors • Low frequency components have increasing power • Can cause problems in any system where low-frequency performance is needed: • Display technology • Communications systems • Project Innovations: • Novel circuit topology for low noise current generation • Onboard signal amplification to reduce noise contamination • System contained in an RFI/EMI Shielded Box to reduce noise contamination • Onboard PC interface to allow programmable bias points and automated measurement Bias Current Generation • JFETs are naturally low noise devices • Use of a JFET allows isolation of the system from the DUT • All system noise can be filtered; only noise contribution is from the JFET • CAD Design of RF/EMI Shielding Box • Contains measurement circuit board, micrometer probes, and silicon wafer • Allows full use of microscope and prober • Maintains full RFI/EMI shielding System Block Diagram Automated Measurement Software Flow • System uses custom digital circuitry, LabView software, and USB and GPIB interfaces to automate control of measurement circuit and various pieces of lab equipment