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IRE Event: shot 030703.39

IRE Event: shot 030703.39. 2003/9/10. Characters of Internal reconnection event （ IRE ） in experiment. 等离子体中心压强迅速下降，时间尺度 100-200 微秒（ thermal quench ）； 热能迅速从芯部向边界输运，电流分布边平； ( 然而 )IRE 事件并没有大的破坏性，观察到 resilience 属性； 随着热淬灭的发生，等离子体电流有约 10% 的增加。 IRE 事件的发生伴随低 m 和 n 模； 等离子体截面拉长（垂直方向）。.

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IRE Event: shot 030703.39

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  1. IRE Event: shot 030703.39 2003/9/10

  2. Characters of Internal reconnection event（IRE）in experiment • 等离子体中心压强迅速下降，时间尺度100-200微秒（thermal quench）； • 热能迅速从芯部向边界输运，电流分布边平； • (然而)IRE事件并没有大的破坏性，观察到resilience属性； • 随着热淬灭的发生，等离子体电流有约10%的增加。 • IRE事件的发生伴随低m和n模； • 等离子体截面拉长（垂直方向）。

  3. IRE Event of Shot 030703.39

  4. Noise before OH initiation

  5. Breakdown delay phase

  6. Multi-resolution analysis of wavelet (1001-1200points)

  7. Lock mode from multi-resolution analysis of wavelet ?

  8. Fast Fourier Analysis: Energy of high frequency

  9. Disruption caused by locked mode ? • Shot 030703.39放电，从磁测量信号观察到了IRE现象？破裂发生在6.9 ms附近。此次放电等离子体的dIp/dt约为26MA/s。 • 从傅立叶频谱分析看，信号的能量主要集中在高频部分>45 kHz,在10k Hz附近也沉积了部分能量;从小波分析看，处于高频段>40 kHZ的锁摸现象很明显，是锁模导致了等离子体的破裂，但是由于ST位形的约束性能而出现了等离子体电流的回弹。---IRE--- • 030109的实验数据没有类似的破裂现象发生 • 锁摸和IRE产生的机理和条件？

  10. Shot 030703.40: locked mode without disruption ?

  11. High frequency (d1) locked mode ?

  12. Multi-resolution analysis of wavelet: No locked mode ?

  13. Compared with shot 030703.39high energy of about 10 kHz

  14. Shot 030703.41 : Without locked mode

  15. Shot 030703.41

  16. Shot 030703.38: Disruption

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