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What Have You Been Missing In Your Pulsed VNA Measurements?. 8 Oct 2013 13:00h - 13:40h Presented by: Bob Buxton. Confidence. on the cutting edge. Pulsed Measurements. Agenda. Background Applications Measurement Overview Common Test Challenges Pulse Measurement Methodologies
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What Have You Been Missing In Your Pulsed VNA Measurements? 8 Oct 2013 13:00h - 13:40h Presented by: Bob Buxton
Confidence • on the cutting edge Pulsed Measurements
Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary
Common Pulse Applications • Measure the reaction of a DUT to a pulsed RF stimulus • E.g., Radar: transmitter, receiver, or both • Measure the reaction of a DUT to pulsed IV (and pulsed RF?) • High power density semiconductors (SiC, GaN) • Traveling-wave-tube amplifiers (TWTAs) • Must synchronize with (ext sync) or control DC bias (pulse gen) • Part of active device test suite • S-parameters • 1 dB compression point • NF, higher order distortion products, harmonics • IMD, IP3 (third-order intercept point)
Radar Courtesy of LCRS Courtesy of Telematics News Courtesy of Raytheon
Radar Radar trends • Narrower pulses • 1 us, 150 m • 50 ns, 7.5 m • Wide range of PRF • Lower, longer range • Higher, shorter • Higher frequencies • Antenna size, bandwidth, smaller target sizes • Key measurement parameters: • Min pulse width/resolution, record length, range of PRFs, frequency range
Pulsed IV (and RF) Electrical • Key measurement parameters: • Pulse profile and min measurement width, point-in-pulse resolution, pulse-to-pulse and PRF range • Used with TWTAs to reduce power consumption • Used at wafer-level to avoid thermal effects • Memory \trapping effects Thermal
Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary
Measurement Overview • Three types of stimulus: * * • Three types of measurements: Pulse Profile (PP) Point-in-Pulse (PIP) Sweep time Sweep freq or power Pulse-to-Pulse (P2P) Sweep time
Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary
Common Test Challenges Too many test method trade-offs Need for better analysis tools Monitor pulse behavior over longer times Eliminating measurement setup errors Timing and synchronization issues (in measurement or calibration)
Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary
Traditional Trade-offs Wideband Method Trade-off: minimum pulse width limitations Historically, wideband pulse measurement is used when most pulse energy is contained in the receiver BW. As pulse widths narrow (e.g., 1 µs), users are forced to move to narrowband techniques.
Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary
Traditional Trade-offs Dynamic range degradation = 20*log[duty cycle] 1% duty cycle = 40 dB D/R reduction! Narrowband Method Trade-offs: • Dynamic range penalty • No pulse-to-pulse capability
Common Test Challenges Too many test method trade-offs Need for better analysis tools Monitor pulse behavior over longer times Eliminating measurement setup errors Timing and synchronization issues (in measurement or calibration)
MS4640B now with: • Option 035 IF Digitizer • Option 042 PulseViewTM • Pulse Modulator Test Sets • (required for RF pulsing)
Eliminate Trade-offs! • Option 035 IF Digitizer enables • 200 MHz Receiver bandwidth • Measurement resolution as fine as 2.5 ns • Independent measurement IF receiver windows • 500 ms record lengths
Common Test Challenges Too many test method trade-offs Need for better analysis tools Monitor pulse behavior over longer times Eliminating measurement setup errors Timing and synchronization issues (in measurement or calibration)
The True View 2.5 ns resolution 15 ns resolution What have you been missing?
Common Test Challenges Too many test method trade-offs Need for better analysis tools Monitor pulse behavior over longer times Eliminating measurement setup errors Timing and synchronization issues (in measurement or calibration)
The True View Example: 100 ms PRI (100 µs, 900 µs period), 10 ns resolution, 30 MHz IFBW Record lengths up to 500 ms -- At full resolution!
Common Test Challenges Too many test method trade-offs Need for better analysis tools Monitor pulse behavior over longer times Eliminating measurement setup errors Timing and synchronization issues (in measurement or calibration)
Measurement Confidence • Visual representation of signals and measurements • Simple generator configuration • Varying types of pulses generated • Singlet • Doublet • Triplet • Quadruplet • Burst • Change labels for better test descriptors
Measurement Confidence • Simple measurement configuration • Adjustments for each receiver
Measurement Confidence Use Zoom Marker to double check test setup Drag vertical lines for start and stop zoom area Drag vertical lines as time markers
Industry-first Instant Results Make measurement adjustments and see the results instantly No need to toggle back and forth between configuration windows
Common Test Challenges Too many test method trade-offs Need for better analysis tools Monitor pulse behavior over longer times Eliminating measurement setup errors Timing and synchronization issues (in measurement or calibration)
Coupled IF Receiver Windows Independent IF Rcvr Windows • Delay start of b2 measurement to properly align S21 result • Measurement results may identify unexpected behavior • For example, there may be measurement delays (from group delay, long test cables, …) which can affect ratio measurements
Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary
Calibration • Power Calibrations • Receiver Calibrations • User RF Calibrations • No stimulus pulsing • Stimulus pulsing • Receive-side modulation/gating
Minimizing Uncertainties • Time • Shaping • Calibration • Minimizing uncertainties • Increase averaging or reduce IFBW • Maximize power (while avoiding compression) • Filtering
Summary • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties
Equipment Selection Criteria • IF bandwidth – sampling rate • Min measurement and timing resolution • Measurement method trade-offs (e.g., dynamic range reduction) • # of pulse generators available • Pulse generation signal formats available (e.g., doublets, bursts, …) • Min pulse width • Pulse modulator performance (e.g., on-off ratio, rise-time, …)
What Have You Been Missing In Your Pulsed VNA Measurements? Innovative high-speed digitizer architecture Industry’s highest resolution measurements Longest record lengths Independent measurement receiver windows Intuitive graphical configuration tool Instant results on measurement parameter changes
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