Scanning Probe Microscope Model: SPA 400, From SIEKO, Japan

1. Scanning Probe Microscope Model: SPA 400, From SIEKO, Japan Scanning Probe Microscope at NML was installed in the year 2004. It works at ambient conditions, is mounted on a vibration free table and has vibration proof chamber to reduce noise. The tip vibrations are monitored by a laser diode based detection system. Microscope is capable of characterizing samples upto a maximum diameter of 35 mm and thickness 5 mm. Two scanners are available : 20 and 100µm which scans down to atomic resolution. The X-Y resolution is 1 Ǻ and Z-resolution is 0.1 Ǻ. It can be used to characterize Metallic, Ceramic, and Biological samples . • Technical Specifications • The Scanning Probe Microscope works with following modes of operations • Atomic Force Microscope (AFM) • Deflection Force Microscope (DFM) • Magnetic Force Microscope (MFM), • Visco-Elasticity Atomic Force Microscope(VE-AFM) and • Visco-Elasticity- Dynamic Force Microscope(VE-DFM) • Scanning Tunneling Microscope(STM) • Electro Chemical- Scanning Tunneling Microscope(EC-STM) Contact Person: Dr. A.K. Pramanick MST Division, National Metallurgical Laboratory (Council of Scientific and Industrial Research) Jamshedpur-831007, India Tel:+91-657-2345014, E-mail: pramanick@nmlindia.org