Sales meeting 2005

1. Discovering the Future Sales meeting 2005 Picosecond Timing Workshop 18 November 2005

2. Production sites, US STURBRIDGE LANCASTER MATAMOROS 1. PHOTONIS Key Facts Lancaster, PA • Photomultipliers • Power Tubes Matamoros, Mexico • Photomultipliers Sturbridge, MA • Microchannel plates • Channel multipliers • Fiber optics Picosecond Timing Workshop 18 November 2005

3. RODEN BRIVE 1. PHOTONIS Key Facts Production sites, Europe Brive, France • Photomultiplier tubes • Image intensifiers • Special products : • Streak tubes • Scientific microchannel plates • Neutron and gamma detectors • Electron multipliers • Multichannel photomultipliers Roden, Netherlands • Image intensifiers • Hybrid Photo-Diode (HPD) Picosecond Timing Workshop 18 November 2005

4. Planacon™ MCP-PMTs • Two inch square flat PMT with dual MCP multiplier. • Anodes, 2x2, 8x8 and 32 x 32 configurations. • Improved Open Area Ratio device now available • Bi-alkali cathode on quartz faceplate. • Easily tiled, low profile, excellent time resolution, excellent uniformity. Picosecond Timing Workshop 18 November 2005

5. PLANACON Family • 50mm Square family of MCP based PMTs • 8500X – 4 anode • 8501X – 64 anode • 8502X – 1024 anode • New improved Active Area Variants available with 86% active area, 85002/85012/85022 • 64 anode PMT available with integrated Anger-logic readout • Gated High Voltage Power Supply available Picosecond Timing Workshop 18 November 2005

6. Improved Open Area Ratio Planacon • Packaging is streamlined to maximize detector area relative to device dimensions • 2.28” sq. vs. 2.50” sq. • 0.45” vs. 0.65” ht. • 86% vs. 66% OAR • 68 gms vs. 128 gms Picosecond Timing Workshop 18 November 2005

7. MCP-PMT Operation photon Faceplate Photocathode Photoelectron DV ~ 200V Dual MCP DV ~ 2000V Gain ~ 106 DV ~ 200V Anode Picosecond Timing Workshop 18 November 2005

8. MCP-PMT Construction Indium Seal Faceplate Ceramic Insulators MCP Retainer Dual MCP Anode & Pins • Spacing between faceplate and MCP and MCP and anode can be varied for different applications • Anode can be easily modified Picosecond Timing Workshop 18 November 2005

9. PMT Processing Cathode Transfer Process (MCP-PMT) Conventional Photocathode Fabrication Electron Scrub e- Process Chamber PUMP PUMP Picosecond Timing Workshop 18 November 2005

10. Comparison with Conventional PMT Picosecond Timing Workshop 18 November 2005

11. Comparison with Conventional PMT Picosecond Timing Workshop 18 November 2005

12. MCP Characteristics • Standard family uses 25m pore size / 32 m pitch / 8° bias angle / 40:1 L:D chevron • Prototypes have been built with 25m pore size / 32 m pitch / 8° bias angle / 60:1 L:D chevron • Long-life glass • Standard dynamic range glass results in ~50 A strip current → Maximum average current of ~5 A • Move to Extended Dynamic Range glass for 500A strip current → Maximum average current of ~50 A • Collection efficiency, including first strike multiplication statistics, is ~60% for 25µm. Picosecond Timing Workshop 18 November 2005

13. Single Electron Spectrum • Good photon counting properties at gains of 0.2 – 1 x 106. Currently working on increasing gain by ~2X. • Peak:Valley typically > 2:1 with uniform illumination of faceplate. • Collection efficiency for single photoelectrons ~ 65%. Picosecond Timing Workshop 18 November 2005

14. Uniformity • Cathode uniformity within 10% over full active area. • Anode uniformity ~ 1.5:1 over the 2” active area in analog mode. • Goal is to obtain 1.2:1 anode uniformity. • Decrease at edge of pixels due to cross-talk • Data provided by Jerry Va’vra, SLAC Picosecond Timing Workshop 18 November 2005

15. Spatial Variations of Detection Efficiency C. Field, T. Hadig, David W.G.S. Leith, G. Mazaheri, B. Ratcliff J. Schwiening, J. Uher,+ and J. Va’vra* Development of Photon Detectors for a Fast Focusing DIRC 5th International workshop on Ring Imaging Cherenkov Counters (RICH 2004), 11/30/2004-12/5/2004, Playa del Carmen, Mexico C. Field, T. Hadig, David W.G.S. Leith, G. Mazaheri, B. Ratcliff, J. Schwiening, J. Uher,+ and J. Va’vra* Picosecond Timing Workshop 18 November 2005

16. Timing Limitations • TTS limited by • Cathode – MCP Gap and Voltage • Recoil electrons (cause long TT shoulder) • Transit time (Variations in p.e. velocity) • Want small gap and high field • MCP-Anode Gap and Voltage • Transit time (variations in electron velocity) • Marginally on recoil electrons (Broadens pulse width) • Want small gap and high field • Pore-size, L:D, and voltage of MCP • Transit time variation through the pore (secondary emission velocity variations) • Want small pore size, minimum L:D and high field Picosecond Timing Workshop 18 November 2005

17. Recoil Electrons Faceplate pe Recoil Electron L MCP • Scattered electrons can travel a maximum of 2L from initial strike • Produces a TTS shoulder • Reduces the DQE for direct detection Picosecond Timing Workshop 18 November 2005

18. 85011 430 Drop Faceplate • Cathode – MCP gap is decreased from to ~0.85mm • Photocathode active area is reduced to 47mm from 50mm Picosecond Timing Workshop 18 November 2005

19. 85011 430 Drop Faceplate Picosecond Timing Workshop 18 November 2005

20. Effect of Reduced PC-MCP Gap C. Field, T. Hadig, David W.G.S. Leith, G. Mazaheri, B. Ratcliff J. Schwiening, J. Uher,+ and J. Va’vra* Development of Photon Detectors for a Fast Focusing DIRC 5th International workshop on Ring Imaging Cherenkov Counters (RICH 2004), 11/30/2004-12/5/2004, Playa del Carmen, Mexico Picosecond Timing Workshop 18 November 2005

21. 32 Anode Timing ResolutionTiming Uniformity C. Field, T. Hadig, David W.G.S. Leith, G. Mazaheri, B. Ratcliff J. Schwiening, J. Uher,+ and J. Va’vra* Development of Photon Detectors for a Fast Focusing DIRC 5th International workshop on Ring Imaging Cherenkov Counters (RICH 2004), 11/30/2004-12/5/2004, Playa del Carmen, Mexico 85011 430 (0.86mm gap) MCP-PMT shows good uniformity over 32 anodes, each anode readout by a separate SLAC CFD channel Picosecond Timing Workshop 18 November 2005

22. Cathode – MCP Transit Time • Increased voltage or decreased gap can drastically reduce the transit time, and therefore transit time spread Picosecond Timing Workshop 18 November 2005

23. Amplification in Pore • Typical secondary yield is 2 • For 40:1 L:D there are typically 10 strikes (210 ~ 103 gain single plate) • Number of strikes depends on velocity of individual secondary electrons Picosecond Timing Workshop 18 November 2005

24. MCP Transit Time • Transit time assumes 10 strike in 40:1 L:D with 1000V applied per plate, Chevron configuration Picosecond Timing Workshop 18 November 2005

25. Future Directions • Increase the anode configurations offered • Improved average anode current (50 – 100 uA) • Step faceplate and anode to optimize timing • MCP input treatment to optimize DQE and reduce recoiling effect • Develop variants optimized for • Photon counting with high spatial resolution • Low cross-talk and magnetic field immunity • Cryogenic Applications • Ultra-low background • Develop other geometries as required by specific markets and applications Picosecond Timing Workshop 18 November 2005