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Compared dumps of LCTs from LCT x Readout (DDU) with LCT (TF).

Compared dumps of LCTs from LCT x Readout (DDU) with LCT (TF). to see if any differences due to readout results can be put into 3 categories Not that this is a brief first look at the 1 st 100 events in run 2553….more detailed analysis is in progress. Category 1: no difference * ~70%.

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Compared dumps of LCTs from LCT x Readout (DDU) with LCT (TF).

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  1. Compared dumps of LCTs from LCT x Readout (DDU) with LCT (TF). • to see if any differences due to readout • results can be put into 3 categories • Not that this is a brief first look at the 1st 100 events in run 2553….more detailed analysis is in progress

  2. Category 1: no difference* ~70% From TF ** L1TriggerEfficiency: processing run #2553 event #1 events so far: 2 E:1 S:1 R:2 C:31 L:0 LCT half-strip/wire group #: 36 / 21 strip pattern: 5 Strip type: 0 with quality: 6 bend: 1 and bxn: 4 E:1 S:2 R:2 C:30 L:0 LCT half-strip/wire group #: 128 / 20 strip pattern: 7 Strip type: 0 with quality: 8 bend: 1 and bxn: 3 From DDU ** L1TriggerEfficiency: processing run #2553 event #1 events so far: 2 E:1 S:1 R:2 C:31 L:0 LCT half-strip/wire group #: 36 / 21 strip pattern: 5 Strip type: 0 with quality: 6 bend: 1 and bxn: 0 E:1 S:2 R:2 C:30 L:0 LCT half-strip/wire group #: 128 / 20 strip pattern: 7 Strip type: 0 with quality: 8 bend: 1 and bxn: 1

  3. Category 2: duplicate LCTs at DDU ~26% From TF ** L1TriggerEfficiency: processing run #2553 event #4 events so far: 1 E:1 S:2 R:2 C:29 L:0 LCT half-strip/wire group #: 144 / 61 strip pattern: 7 Strip type: 0 with quality: 2 bend: 1 and bxn: 4 E:1 S:3 R:2 C:30 L:0 LCT half-strip/wire group #: 24 / 48 strip pattern: 2 Strip type: 0 with quality: 8 bend: 0 and bxn: 3 From DDU ** L1TriggerEfficiency: processing run #2553 event #4 events so far: 1 E:1 S:2 R:2 C:29 L:0 LCT half-strip/wire group #: 144 / 61 strip pattern: 7 Strip type: 0 with quality: 2 bend: 1 and bxn: 1 E:1 S:2 R:2 C:29 L:0 LCT half-strip/wire group #: 144 / 61 strip pattern: 7 Strip type: 0 with quality: 0 bend: 1 and bxn: 1 E:1 S:3 R:2 C:30 L:0 LCT half-strip/wire group #: 24 / 48 strip pattern: 2 Strip type: 0 with quality: 8 bend: 0 and bxn: 0 E:1 S:3 R:2 C:30 L:0 LCT half-strip/wire group #: 32 / 49 strip pattern: 7 Strip type: 0 with quality: 0 bend: 1 and bxn: 0 Ok, MPC filters LCTs with Q = 0

  4. Category 3: LCTs found at TF but not DDU ~3% From TF ** L1TriggerEfficiency: processing run #2553 event #14 events so far: 11 E:1 S:2 R:2 C:30 L:0 LCT half-strip/wire group #: 16 / 61 strip pattern: 2 Strip type: 1 with quality: 11 bend: 0 and bxn: 4 E:1 S:2 R:2 C:30 L:0 LCT half-strip/wire group #: 16 / 60 strip pattern: 2 Strip type: 1 with quality: 11 bend: 0 and bxn: 4 E:1 S:3 R:2 C:30 L:0 LCT half-strip/wire group #: 72 / 44 strip pattern: 2 Strip type: 0 with quality: 10 bend: 0 and bxn: 3 E:1 S:3 R:2 C:30 L:0 LCT half-strip/wire group #: 0 / 44 strip pattern: 5 Strip type: 0 with quality: 6 bend: 1 and bxn: 3 From DDU ** L1TriggerEfficiency: processing run #2553 event #14 events so far: 11 E:1 S:3 R:2 C:30 L:0 LCT half-strip/wire group #: 72 / 44 strip pattern: 2 Strip type: 0 with quality: 10 bend: 0 and bxn: 0 E:1 S:3 R:2 C:30 L:0 LCT half-strip/wire group #: 0 / 44 strip pattern: 5 Strip type: 0 with quality: 6 bend: 1 and bxn: 0

  5. Summary • Categories 1 and 2 are one in the same since MPC filters out Q=0 LCTs. • Category 3 needs further investigation. • Slava looked at the events and found that there was an ALCTs at DDU, but no CLCTs. • CLCTs being lost at readout at DDU Even though TF finds them??

  6. Other items • Greg worked with me to improve algorithm of efficiency code and add functions to clean up code • Still some work to be done…. • In ME3/2, chamber 31’s efficiencies lower than rest. Looked into these events with Slava, but found nothing conclusive….no CLCT info form DDU. Slava suggests 2/2/2 trigger conditions. • Increased roads of segments by a factor of 10(see Eric James’ talk at Purdue EMU meeting) • Number of chambers with 1 segment incresed from ~46K to ~74k

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