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Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering

ELEC5970-003/6970-003/Fall 2004 Advanced Topics in Electrical Engineering Designing VLSI for Low-Power and Self-Test Class Projects and Presentations. Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University

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Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering

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  1. ELEC5970-003/6970-003/Fall 2004Advanced Topics in Electrical EngineeringDesigning VLSI for Low-Power and Self-TestClass Projects and Presentations Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University http://www.eng.auburn.edu/~vagrawal vagrawal@eng.auburn.edu ELEC 5970-003/6970-003 Class Projects

  2. Student Evalulation • Homework (30%) – three • Student presentation (10%) • Research paper (30-60%) – a publishable paper will exempt the student from the final exam • Final Exam (0-30%) ELEC 5970-003/6970-003 Class Projects

  3. Project 1: Mixed-Signal BIST • Select an analog function in a mixed-signal environment. • Develop a specification-based test procedure. • Design a digital TPG and an ORA with measurable output. • Analyze ORA for tolerance characteristic and aliasing. ELEC 5970-003/6970-003 Class Projects

  4. Digital System Inputs Analog System Outputs Mux Test Analog Analog Analog Control System Circuit Circuit Inputs TPG BIST Start Analog MUX BIST Done Digital ORA Pass/Fail System Outputs Mixed-Signal BIST – Stroud, Dai • Digital circuitry tests analog circuitry • Minimum overhead & impact to analog circuitry Capable of automatic measurement: gain, linearity • Developed parameterized HDL models • Automatic synthesis in any mixed-signal system Digital Circuitry Analog Circuitry System Function DAC 101011000111011010 101011000111011010 System ADC Function ELEC 5970-003/6970-003 Class Projects

  5. Reference • F. Dai, C. Stroud, D. Yang and S. Qi, “Automatic Linearity (IP3) Test with Built-In Pattern Generator and Analyzer,” Proc. International Test Conference, October 2004. • M. Burns and G. W. Roberts, An Introduction to Mixed-Signal IC Test and Measurement, New York: Oxford University Press, 2001. ELEC 5970-003/6970-003 Class Projects

  6. Project 2: Spectral BIST • Develop TPG and ORA circuits for testing of digital circuits. • Analyze overhead, coverage and aliasing. ELEC 5970-003/6970-003 Class Projects

  7. Spectral Testing Main ideas: • Meaningful inputs (e.g., test vectors) of a circuit are not random. • Input signals have spectral characteristics that are different from white noise (random vectors). ELEC 5970-003/6970-003 Class Projects

  8. Statistics of Test Vectors 100% coverage Tests: a a 00011 b 01100 c 10101 b c • Test vectors are not random: • Correlation: a = b frequently used. • Weighting: c has more 1s than a or b. ELEC 5970-003/6970-003 Class Projects

  9. Spectral Test Generation Initial vectors (random) Fault coverage ? Fault simulation and vector- compaction Stop ok low Add filtered vectors to test set Compute spectral coefficients (Hadamard Functions) ELEC 5970-003/6970-003 Class Projects

  10. Spectral Test Results Circuit name s5378 b12 HITEC Det vec CPU s 3231 912 1104 - - - Strategate Det vec CPU s 3639 11571 2268 1488 33113 9659 Spectral ATPG Det vec CPU s 3643734 44 1645 4464 24 CPU: Ultra Sparc 10 HITEC: Nierman and Patel, EDAC’91 Strategate: Hsiao et al., ACMTDAES’00 ELEC 5970-003/6970-003 Class Projects

  11. Reference • A. Giani, S. Sheng, M. S. Hsiao, and V. D. Agrawal, “Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment,” Proc. 19th IEEE VLSI Test Symp., 2001, pp. 163-168. ELEC 5970-003/6970-003 Class Projects

  12. Project 3: Low-Power Adiabatic Logic • Basic Idea – If we charge a capacitor C to voltage V in n equal increments, then the energy required by each increment is C(V/n)2 = (1/n2) CV2 • The total energy of n-step charging is 1/n of that required to charge the capacitor to the full voltage V in one step. ELEC 5970-003/6970-003 Class Projects

  13. Adiabatic CMOS Circuits • Low-Power circuits have been designed with time-varying (periodic) power supply. • The objective is to analyze: • Effect of the shape (sinusoidal, triangular, etc.) of the power supply waveform on power dissipation. • Effect of the supply frequency on delay and power of the circuit. • Possibly treat supply as AC instead of DC. ELEC 5970-003/6970-003 Class Projects

  14. Related Ideas for Investigation • Energy recovery • Reversible Logic VDD ELEC 5970-003/6970-003 Class Projects

  15. Reference • Y. Ye and K. Roy, “QSERL: Quasi-Static Energy Recovery Logic,” IEEE J. Solid State Circuits, vol. 36, no. 2, pp. 239-248, Feb. 2001. ELEC 5970-003/6970-003 Class Projects

  16. Project 4: Submicron Leakage Power Reduction • Recent references. ELEC 5970-003/6970-003 Class Projects

  17. Project 5: ISA for Low Power • Recent references. ELEC 5970-003/6970-003 Class Projects

  18. Project 6: Power Estimation Algorithms • Mixed-levels of hierarchy • Glitch, leakage and short-circuit power • Recent references ELEC 5970-003/6970-003 Class Projects

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