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Institute of Applied Microelectronics and Computer Engineering. Algorithm for Fast Statistical Timing Analysis Jakob Salzmann , Frank Sill, Dirk Timmermann SOC 2007, Nov ‘07, Tampere, Finland. University of Rostock. Outline. Motivation Static Timing Analysis Statistical Timing Analysis
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Institute of Applied Microelectronics and Computer Engineering Algorithm for Fast Statistical Timing AnalysisJakob Salzmann, Frank Sill, Dirk TimmermannSOC 2007,Nov ‘07, Tampere, Finland University of Rostock
Outline • Motivation • Static Timing Analysis • Statistical Timing Analysis • Simulation Results • Conclusion & Outlook
Motivation(1) • Progressive transistor scaling leads to higher impact of parameter variations • Physical on-chip variations due to • Imprecise fabrication process • Gate oxide thickness • Transistor width, length • Doping • Environment • Ambient temperature • Cooling • Time • Electro migration • Mechanical stress • Thermal stress
I1 I2 Delay Y Time I1 Y I2 I1 I2 Y Time Motivation(2) • Parameter variations lead to unpredictable timing behavior • Chips compete against each other • Before market entry, knowledge about maximum speed in the worst case • Step forward: Information on speed distribution of a chip production set • Most chips are faster than worst case speed! ? Delay ?
I1 I2 Y Worst case delay Time Static Timing Analysis Classic Approach: Worst case analysis • Estimate margins of all parameters • Find parameter set which results in worst case delay • Simulate gate delay with worst case inputs • Add delays of each data path to get resulting delay of the circuit • No realistic representation of timing behavior • Overstated circuit delay
μ – mean value μ σ – standard deviation σ PDF: Statistical Timing Analysis(1) Innovative Approach • Estimate margins and Gaussian distribution of all possible parameters • Monte-Carlo simulations to get delay probabilities • Estimate Probability Density Function (PDF) of gate delay • Calculate PDF of overall delay • More realisticrepresentation of timing behavior • Prediction how many circuits match estimated delay
Statistical Timing Analysis(2) Multi input switching (MIS) Former approach [Aga04] Lot of simulation sets per gate Imprecise calculation of standard deviation #Simulation sets ~ #input² High calculation effort • Single input switching (SIS) • Simple mathematical approach • µY = µ1 + µ2, σY² = σ1² + σ2² • Correlations between gates • Not within scope of this presentation Our new approach Only one simulation set per gate No underestimation ofstandard deviation Simple extension to gates with more than 2 inputs Low calculation effort
Statistical Timing Analysis(3) Multi input switching – Simulation Theses: • Resulting mean value depends on • Gate PDF • Input PDF • Order and time differences of inputs • µYincreases in case of proximate inputs with high standard deviations • µGincreases by proximate inputs • Resulting standard deviation depends on dominating input Difference between Input Mean Values [ps]
I I σY² = σI² + σG² µY = µI + µG Statistical Timing Analysis(4) Approach to calculate proximate effect and dominating input • Separate behavior of gate into impact of Inputs and Gate itself • “Resulting Input PDF“ by convolution of all Input-PDFs • Addition of “Resulting Input PDF“ and ”Gate PDF” by Single Input Switching algorithm
Statistical Timing Analysis(4) Approach for Resulting „Input PDF“ by convolution of all Input-PDFs • Integration of all „Input PDF“ to obtain their Cumulative Density Function (CDF) • Approximation of all „Input CDF“ by a set of linear equations • Multiply the edges of the „Input CDFs“ approximations to get a “Resulting Input CDF“ Mean value by intersection with probability 0.5 Standard deviation by root-mean-square deviation of the points of the “Resulting Input CDF” from mean value
Three example cases HSpice Approximation Case1: σA = 5ps, σB= 10ps Case2: σA= 20ps, σB= 40ps Case3: σA= 40ps, σB= 80ps Simulation Results(1) • Algorithm must not underestimate gatedelay! • Calculated mean value ≥ Simulated mean value • Calculated standard deviation ≥ Simulated standard deviation NAND2 - Gate
I1 I2 I3 ... Y ... I31 I32 Simulation Results(2) • Tree structure – worst case of switching behavior
Conclusion & Outlook • Goal: Developing algorithm for calculating statistical timing behavior of a Multi Input Gate • Only one simulation set per gate • No underestimation ofgate delay • Simple extension to gates with more than 2 inputs • Low calculation effort • Automatic tool for calculating statistical timing behavior of larger (and real) circuits
Questions? Thank you for your attention! References [AGA04] A. Agarwal, F. Dartu, and D. Blaauw; Statistical Gate Delay Model Considering Multiple Input Switching, 41st Design Automation Conference, USA, 2004