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Dimuon Arm layout

Dimuon Arm layout. A = FE Electronics (MANU) B = CROCUS Crate C = TCI Crate (below dipole magnet). A = 500 Rad & 5.6 10 11 cm -2 B  170 Rad & 1.9 10 11 cm -2 C  1.4 Rad & 2.6 10 8 cm -2 (this last case is not worrisome).

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Dimuon Arm layout

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  1. FF - 30/08/04 Dimuon Arm layout A = FE Electronics (MANU) B = CROCUS Crate C = TCI Crate (below dipole magnet) A = 500 Rad & 5.6 1011 cm-2 B 170 Rad & 1.9 1011 cm-2 C 1.4 Rad & 2.6 108 cm-2 (this last case is not worrisome) Simulated doses in Tracking Chambers for 10yrs of ALICE

  2. FF - 30/08/04 MANU = ZONE A CROCUS = ZONE B Components for irradiation TCI = ZONE C

  3. FF - 30/08/04 Energy spectra of neutrons (most important component of radiation) 2MeV 20MeV Only ~10% of the total hadron fluence (2MeV) contributes to the radiation effects Fluences to consider for SEE (10yrs of ALICE): A = 5.6 1010 cm-2 B = 1.9 1010 cm-2 90% 8.4% 1.6% THERMAL NEUTRONS

  4. FF - 30/08/04 Results from “already known”components

  5. FF - 30/08/04 Test Beam at Centre de Protontherapie d’Orsay (CPO) = protons 50-200MeV (DUT 1 & 2 = 21.8kRad; DUT 3 = 12.8kRad) DUT 1 = 4 MANAS (Pedestals, Noise and Gain) DUT 2 = ADC Voltage Ref (Vout) DUT 3 = MARC (BERR in config RAM and with only data = 0s or FFFs) Ipwr monitored for SEL

  6. FF - 30/08/04 500Rad 64 chs of MANAS: Noise and Pedestals -19 ADC counts 5 days annealing 64 chs of MANAS: Gain parameters (2nd order fitting) (calibration signals 0-120fC, internal capacitors)

  7. FF - 30/08/04 500Rad Vref ADC Errors in MARC (RAM of thresholds) (no SEUs in functional circuit) 5.6 1010 (>2MeV) 5mV drop (Fully recovers after 4 days) • 8.1 bit errors/MARC/10yrs • 23 SEU/day in sation1 • 56 SEU/day whole detector • <16 THRs affected by SEU / 6 hours beam life time

  8. FF - 30/08/04 F.F. conclusions: • Test campaign well started • No problems in Mu Arm Trk Chambers for TID. • Only SEE to test • Main custom chips (MANAS, MARC) are ok • Important verification to be done in zone A is the ADC • Work to be concluded: • CROCUS crate electronics to test, • because devices that can affect large part of system.

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