High purity x-ray polarimetry

1. High purity x-ray polarimetry Ingo Uschmann B. Marx, K. Schulze, S. Hoefer, R. Loetzsch, T. Kämpfer, O. Wehrhan, H. Marschner, E. Förster, M. Kaluza, H. Gies, G. Paulus, T. Stöhlker Helmholtz-Institut Jena, Helmholtzweg 5, Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität, 07743 Jena C. Detlefs, T. Roth, J. Härtwig,ESRF R. Röhlsberger, H.C. Wille, K. Schlage,DESY -PETRA III W. Wagner, FZD Dresden Petawatt-Lasers at Hard X-ray Light Sources, Dresden, 08.09.2011

2. Content History and Motivation Method and Realization Experimental Results Summary and Outlook

3. First polarization experiment with x-rays 1906 J. Barkla X-ray scattering 1917 Nobel prize

4. First observation of optical activity in the x-ray range 1981 0.8 kW X-ray tube Cu K Presicion of 5 arcmin (1.4 mrad) after 24 hours accumulation M. Hart, A.R.D. Rodrigues, 1981

5. Faraday effect in the x-ray range 1991 Source synchrotron: Divergence: 200 µrad Error of rotation: 2.10-4 rad Sensitivity: 70 µrad Polarization ratio: 2 x 10-6 M. Hart P. Siddons et al., RSI, 1991 1997 R. Roehlsberger, T. Toellner, polarization purity of ~4x10-8 X-ray polarimetry at Synchrotrons is today a standard method for study of magnetic Materials and resonant nuclear scattering

6. Motivation of further development of x-ray polarizers Observation of vacuum birefringence At photon energies small compared to the electron mass electrons and positrons will not generally produced as real particles. But: Euler and Heisenberg: „ … even in situations where the photon energy is not sufficient for matter production, its virtual possibility will result in a ´polarization of vacuum´ and hence in an alteration of Maxwell´s equations“ 1936 T. Heinzl et al. 2006 Strong electric field induced phase shift of a electromagnetic wave in birefrigent vacuum:  = 4/15 z0/ Io/Ic k , for I0=1022 W/cm2 and  = 1 A … ellipticity ~ ()2~10-11 • - Sommerfelds fine structure constant z0 interaction length  - wavelength Io –electric laser field Ic = 1.3 x 1018 V/m critical field for pair production in constant electric field

7. Proposed QED-experiment with high Power Laser This challenging experiment consist of three subprojects 1- development of X-ray polarimetry 2- development of the X-ray source 3- development of the Petawatt laser

8. Basics for x-ray polarizerdynamical theory of x-ray diffraction with perfect crystalsEwalds sphere for the two beam case Kh G  Ko incident beam Kh diffracted beam G reciprocal lattice vector  Bragg angle K0 Polarisation state depends on the scattering angle 2 Integrated reflectivity Ri ~ 1 for  - polarization Ri~ cos (2) for  – polarization

9. Reflection curves for sigma- and pi- component at 10° Bragg angle

10. Reflection curves for sigma- and pi- component at 47° Bragg angle

11. Generation of linear polarization state of x-rays • X-ray diffraction of x-rays at an Bragg angle close to 45° • Borrmann effect in the transmission case germanium 220, thickness t=1 mm, Cu K Normal absorption µt = 34.17, exp(-µt)=1.5x10-15 sigma µe=1.3, exp(-µet)=0.272 pi µe=11.9, exp(-µet)=6.5x10-6 3. Channel cut by using multiple reflection 4. Using transmitted x-rays of a collimated X-ray beam, Bragg reflected by a crystal

12. Energy dependent rocking curves for Bragg angles at 45°,only sigma component

13. Linear polarization by Bragg reflection close to B=45° Integrated reflectivity Ri ~ 1n for  - polarization Ri~ cos n(2) for  – polarization n-number of bounces n=1 n=2 n=4

14. Efficiencies of 4-, 6-,and 8- bounces channel-cut crystals

15. High purity x-ray polarimetry Best value before: 4x10-8 , at 14.4 keV and a Bragg angle of 45.1°, R.Roehlsberger et al., NIM 1997

16. 1. Simulation of multiple diffraction, which disturbs the polarisation degree.

17. 2. Simulation of multiple diffraction, which disturbs the polarisation degree. Additional reflection Umweganregung

18. 1. Simulation of multiple diffraction, which disturbs the polarisation degree. All reflection calculated: Silicon crystal, =0.19 nm, 6.9 keV 400 reflection used It can be suppressed by well selected and precise crystal orientation.

19. 1. Simulation of multiple diffraction, which disturbs the polarisation degree. All reflection calculated: silicon crystal, =0.055 nm, 22 keV, 888 reflection used

20. The first Jena X-ray polarimeter 4 reflection channel cut

21. The first Jena X-ray polarimeter Jena, summer 2009

22. First polarization purity measurement – X-ray tube Rocking curves for different analyzer positions Si 333 reflection, Cu K, B= 47.43°, 4 symmetric reflection at each channel cut, Time for the 90° curve took 3 days. Determined purity: 3.9x10-4, Limitation by X-ray tube (Brilliance and Bragg angle)

23. Brilliance of present x-ray sources Undulator parameters: 1013….1014 photons/s/eV Source size: 30 µm x 300 µm Divergence: 42 µrad, 16.9 µrad Authier, Dynamical theory of x-ray diffraction

24. Experimental campaign at ID 06 at ESRF: 1.-7. December 2009 Undulator radiation: Alternative two undulators are available for 3…10 keV and 10 keV … (30 keV): Highest photon flux is available at 10 keV (second undulator): ~1015 photons/s Energy band width: ~ 10 eV Polarisation degree: > 99%, horizontal rms e--divergence: 10.3 µrad Photons after the Silicon 111 monochromator (band width ~1 eV): ~1014 photons/s Photons after the first polarizer: ~1012 photons/s Photons after the second polarizer (parallel position): ~1010 photons/s X-ray hutch Storage ring x-ray beam size at the polarimeter: horizontal: 1.5 mm vertical beam size. 0.5 mm horizontal rms e--divergence: 10.3 µrad vertical rms e--divergence: 2.9 µrad

25. Experimental campaign at ID 06 at ESRF - Polarizer

26. Experimental campaign at ID 06 at ESRF - Analyzer

27. Rocking curves at parallel - and cross position ESRF winter 2009 B. Marx et al., Opt. Commun., 284 (2011), pp. 915

28. Polarization purity measured at 6457 eV, Si 400 4 reflection channel cut B. Marx et al., Opt. Commun., 284 (2011), pp. 915

29. Polarization purity measured at different photon energies Si 444 Eph=11183 eV Si 800 Eph=12914 eV B. Marx et al., Opt. Commun., 284 (2011), pp. 915

30. Polarization purity measured at different crystal azimuth Si 800 Eph=12914 eV

31. Application: phase variation of x-rays by diffraction

32. High Purity X-ray Polarimetry Sensitive phase determination by the X-ray polarimeter ESRF Sept. 2010

33. Experimental campaign at ID 01 at PETRA III: August 2011 Polarization purity of the undulator at ID01: 4.4x10-4 Beam diameter 3 mm x 3 mm

34. Summary • We measured a polarization purity of • The detection of ellipticity of the order of 10-11 becomes possible • for Laser pump-X-ray probe the synchrotron of third generation has to long pulses and high repetition rate • alternative source – x-ray laser • The polarisation purity can still be improved by more sophisticated methods 1. tilted channel cuts 2. asymmetric reflection 3. suppression of multiple reflections and thermal diffuse scattering crystals with lower Z, diamond crystal cooling • The new extremly sensitive method, presently not existing will be able to detect newly weak polarisation effects in the x-ray regime Cotton-Mouton effect Fararday effect 2.4 x 10-10 at 6457 eV 6.2 x 10-10 at 12913 eV

35. Outlook 1. Experiments at LCLS: next step to the QED experiment: Synchrotron: 350 MHz repetition, 30000 photons per pulse, pulse duration: 100 ps LCLS: 10 Hz repetition, 1012 photons per pulse, pulse duration: 70 fs weak effects becomes visible in single x-ray pulses!!! ??? Nonlinear effects might destroy the purity??? 2. High purity polarimeter as optical shutter similar to optical polarimeter by using fast processes, i.e. optical phonons or piezzo effect 3. Optical pump laser: 1. high intensity, pulse duration ~ like XFEL 2. small focus size 1…3 µm, 3. high temporal average of energy, rep. rate like XFEL