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Vacuum Testing of LHCb Sensors by W. Kucewicz: Results and Analysis

Detailed analysis of the vacuum testing conducted between 9th August and 2nd September on LHCb sensors by W. Kucewicz, focusing on IV characteristics and the influence of temperature fluctuations.

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Vacuum Testing of LHCb Sensors by W. Kucewicz: Results and Analysis

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  1. Vacuum Test 8th August – 2nd September LHCb Sensor – W.Kucewicz

  2. Strip Strip Strip Strip PHI 2391- 19A PHI 2391- 21 D PHI 2313- 17C PHI 2313- 20 Guard Guard Guard Guard Test setup Vacuum system Switch I T Temp V 350V Backplane bias LHCb Sensor – W.Kucewicz

  3. IV characteristics of PHI 2313-17C LHCb Sensor – W.Kucewicz

  4. IV characteristics of PHI 2391-21D LHCb Sensor – W.Kucewicz

  5. IV characteristics of PHI 2313-20 LHCb Sensor – W.Kucewicz

  6. IV characteristics of PHI 2391-19A LHCb Sensor – W.Kucewicz

  7. 9 August – 2 September 2005 Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  8. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  9. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  10. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  11. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  12. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  13. Conclusion • Vacuum test was done from 9 August till 2 September. • It was tested 4 sensors sitting in vacuum chamber at 4*10^-8 Tr, measuring strip and guardring currents of each at 350V. • No significant fluctuation of current was observed after slight current increasing in the first days of the test. • Seems that the temperature fluctuation has more significant influence to the characteristics than vacuum ambient (look at point around the 24 day) LHCb Sensor – W.Kucewicz

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