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Energy optimization for probabilistic boolean logic circuits and its applications. Presenter: Yung-Chun Hu Advisor: Prof. Chun-Yao Wang 2014/06/16. Outline. Introduction Problem Formulation Power Optimization Applications Experimental Results Conclusion. Probabilistic CMOS.
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Energy optimization for probabilistic boolean logic circuits and its applications Presenter: Yung-Chun Hu Advisor: Prof. Chun-Yao Wang 2014/06/16
Outline • Introduction • Problem Formulation • Power Optimization • Applications • Experimental Results • Conclusion
Probabilistic CMOS Noise effect Lower VDD
Energy of a Probabilistic Inverter Energy per switching: Energy ratio Probability
Probabilistic Boolean logic • Notations • OR: • AND: • NOT: • Let probabilistic parameter A 0.9 F B
Voltage v.s. probability • PTM 45nm SPICE model INV NAND2
Correctness Definition • Correctness under an input pattern • Golden value = 1: • Golden value = 0: • Correctness of POj:
Problem formulation • Problem formulation: • Given: • A Boolean circuit • A library of probabilistic gates • Correctnessconstraint • Determine: The locations of probabilistic gates such that power consumption minimized
Outline • Introduction • Problem Formulation • Power Optimization • Applications • Experimental Results • Conclusion
testability • A Statistic-based approach to testability analysis,C.-C. Chiou et al, 2008 • Notations: • V(wire/gate): simulation results on a wire/gate • Cr(wire/gate): criticality vector on a wire/gate • The change of critical bits will cause at least one PO change.
Testability 0.25 1 0.5 1 1 0.5
Testability 0.25 1 1 0.5 4 1 2 5 1 0.5 6 3
PO-aware Testability 0.083 0.33 0.25 0.33 0.33 0.167
PO-aware Testability 0.083 1 0.33 4 0.25 3 0.33 5 0.33 0.167 6 2
Po-aware testability • # of probabilistic gates=2, p=0.9 • Since we build the criticality vectors for each PO, the weighted PO-aware testability can be obtained through the following equation:
Outline • Introduction • Problem Formulation • Power Optimization • Applications • Experimental Results • Conclusion
Applications • Three applications • 32-bit adder • Average image filter • Edge detector • Weighted correctness and testability evaluation: for ith bit
adder • AVG_Weighed_Correctness=99
adder • AVG_Weighed_Correctness=95
adder • AVG_Weighed_Correctness=91
adder • Error & Power
Average image filter • An average image filter can be used to soften an image. • For every pixel, the filter averages its surround 8 pixels and itself.
Average image filter • Resultant images and PSNR values
Average image filter • AVG_Weighed_Correctnessv.s. PSNR value
Average image filter • AVG_Weighed_Correctnessv.s. power
Average image filter • AVG_Weighed_Correctnessv.s. normalized power Around 20% power reduction
Edge detector • Sobel operation: , where A is the source image and is convolution operation • Approximation:
Edge detector • The difference between Sobel operation and approximation • PSNR: 47.67
Edge detector • Resultant images and PSNR values
Edge detector • AVG_Weighed_Correctnessv.s. PSNR value
Edge detector • AVG_Weighed_Correctnessv.s. power
Edge detector • AVG_Weighed_Correctnessv.s. normalized power Around 10% power reduction
Outline • Introduction • Problem Formulation • Power Optimization • Applications • Experimental Results • Conclusion
Experimental results • The relationship between switching energy consumption and correctness under (a) AVG_Correctness for alu4. (b) AVG_Correctness for dalu.
Experimental results • The ratios of probabilistic gates and switching energy consumption in PBCs with voltage domains of 1.0V, 0.9V, or 0.8V under the AVG_Correctness constraint of 90%
Experimental results • The ratio of circuit delay under AVG_Correctness constraint of 90%for 0.8V voltage domain
Experimental results • Probabilistic gate number comparisom between different strategies under AVG_Correctness constraint of 90%for 0.8V voltage domain
Experimental results • Power-delay-product of PO-aware testability-based strategy under AVG_Correctness constraint of 90%for 0.8V voltage domain
Conclusion • This is the first work that discusses the power minimization of PBC designs • We propose a power minimization flow that efficiently reduces the power consumption of PBC designs