1 / 28

Summary of NSF Surface Analysis Workshop

Summary of NSF Surface Analysis Workshop. Kettering University, Flint, Michigan 23-27 June 2003. Ronald Kumon Summer 2003. Purposes of Workshop. Provide an overview of a variety of surface analysis techniques and their applications

erwin
Download Presentation

Summary of NSF Surface Analysis Workshop

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. Summary of NSF Surface Analysis Workshop Kettering University, Flint, Michigan 23-27 June 2003 Ronald Kumon Summer 2003

  2. Purposes of Workshop • Provide an overview of a variety of surface analysis techniques and their applications • Expose participants to “cutting edge” experimental equipment • Share ideas for hands-on experiments that are primarily suitable for inclusion in an undergraduate curriculum

  3. Schedule • Monday : Overview, facilities tour, optical microscopy • Tuesday : Vibrational spectroscopy (Raman and IR) • Wednesday: Electron spectroscopy (ESEM, ESCA/XPS) • Thursday : Scanning probe microscopy (STM, AFM) • Friday : Conclusion and evaluation

  4. Participants • 9 participants: 6 chemistry, 3 physics • Professors, postdocs, graduate students • Universities, colleges, community colleges Instructors • Prof. Bahram Roughani, Physics • Prof. Diana Phillips, Chemistry • Mr. Robert Cunningham, Lab Coordinator

  5. Information from Surfaces • Elemental composition • Chemical composition • Morphology • Surface homogeneity • Crystalline structure • Elastic properties • Electrical properties

  6. Examples of Applications • Microelectronics • Catalysis • Nanotechnology • Drug Delivery • Fuel Cells • Corrosion • Coatings and Adhesion

  7. Applicable Courses • Modern Physics • Materials Characterization • Physical Chemistry • Polymer Chemistry • Surface Analysis (special topics) • Undergraduate Research • Graduate Research

  8. Experimental Considerations • What do you want to know? • How fast do you need the answer? • How much do you want to spend? • Is the sample vacuum compatible? • Does the sample absorb radiation? • Do you need certain temperatures, pressures, or chemical environment? • How stable is the sample’s surface?

  9. Vibrational Spectroscopy • Infrared (IR) absorption • Provides information about chemical bonding • Done in transmission or reflection • Raman scattering • Provides information about chemical bonding, crystalline structure, etc. • Weaker than dominant Rayleigh scattering

  10. Comparison of Spectra Water vibrations • Spectra are typically complementary

  11. IR Laboratory Example of IR spectrum Thermo Nicolet Avatar 360 FT-IR

  12. Raman Laboratory Side view of Raman spectrometer Sample holder and microscope

  13. Electron Micro-/Spectroscopy • Environmental Scanning Electron Microscopy (ESEM) • Electron Spectroscopy for Chemical Analysis (ESCA), a.k.a., X-ray Photoelectron Spectroscopy (XPS) ESEM ESCA

  14. ESEM Laboratory Sample images Environmental SEM and EDX system

  15. ESCA Laboratory Front view of ESCA system Top view of ESCA system

  16. Scanning Probe Microscopy • Scanning Tunneling Microscopy (STM) • Probability of electron tunneling varies exponentially from tip • Atomic Force Microscopy (AFM) • Sensitive to force between surface and tip • Tip deflection measured by laser beam deflection of cantilever STM AFM

  17. STM Demonstration View of probe tip through magnifier Top view of STM

  18. AFM Demonstration AFM probe tips Pacific Nanotechnology AFM system

  19. AFM NDE Imaging

  20. Magnetic F.M. with Legos Laser beam deflection changes when arm moves over magnets

  21. Polymer Applications • IR, Raman for uncured adhesive samples • IR, Raman, ESCA, ESEM, AFM for cured adhesive samples • Several samples of uncured and cured epoxy left at Kettering for further analysis • Examples of various techniques shown on the next slides

  22. IR analysis of adhesion Identification of adhesive material

  23. Raman imaging of epoxy Raman image of thin film of rubber-toughened epoxy resin at 1665 cm-1 [Garton et al., Appl. Spectrosc. 47, 922-927 (1993)]

  24. ESCA of adhesion • Painted plastic parts were glued to body of vehicle • Samples with more Si tended to fail more often (from U. W. Ontario Surface Science web site)

  25. ESEM and EDX analysis of cured epoxy

  26. AFM Imaging of Polymers LFM Structured polymer (topo+LFM) PCM Block co-polymer (topo+PCM)

  27. Conclusion • Learned about surface analysis techniques • Exposed to ideas for adding surface analysis methods into undergraduate and graduate curriculum • Met other physicists and chemists • Obtained some ideas about potential directions for future research

  28. Acknowledgments • National Science Foundation • Georgia State University • Kettering University • University of Windsor Presentation archived at: http://ron.kumonweb.com/pro/research.html

More Related