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Lecture 2: Resistivity

Lecture 2: Resistivity. 1.2 The Four-Point Probe. Big difference: two point and four point measurements. Big difference. For an arbitrarily shaped sample,. 1.2.1 Correction Factors. For collinear or in-line probes with equal probe spacing (s),.

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Lecture 2: Resistivity

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  1. Lecture 2: Resistivity 1.2 The Four-Point Probe Big difference: two point and four point measurements

  2. Big difference

  3. For an arbitrarily shaped sample, 1.2.1 Correction Factors For collinear or in-line probes with equal probe spacing (s), For a non-conducting bottom wafer surface boundary, For a conducting bottom wafer surface boundary,

  4. Make it simpler……thin sample and bottom non-conducting: Make it simpler……t<s/2, F2=1, F3=1:

  5. For circular wafers (D):

  6. For near boundary: F3

  7. 1.2.2 Resistivity of Arbitrarily Shaped Samples Van der Pauw (1958)

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