380 likes | 388 Views
Improving the RF Active Circuit Design Cycle Through Innovations in Electrothermal Modeling, Characterization, and Design Techniques. Dr. Charles Baylis Faculty Candidate baylis@eng.usf.edu April 11, 2008. Overview. USF RACAM Research Group The RF Active Circuit Design Cycle
E N D
Improving the RF Active Circuit Design Cycle Through Innovations in Electrothermal Modeling, Characterization, and Design Techniques Dr. Charles BaylisFaculty Candidatebaylis@eng.usf.eduApril 11, 2008
Overview • USF RACAM Research Group • The RF Active Circuit Design Cycle • Research Strategy/Overview • Nonlinear Modeling of Thermal and Trapping Effects in GaN HEMTs • Radar Power Amplifier Combining Techniques for Sidelobe Reduction • Prediction of Phase Noise in Amplifiers and Frequency Multipliers • Development of Microwave Measurement Techniques for Cell Cultures
RACAM at USF • 4 graduate students, 2 undergraduate students
RF Active Circuit Design Cycle Design Measurements Simulation Models Fabrication Testing SUCCESS!!! Good models can eliminate this path.
Strategy for Obtaining Funds • Obtain initial grass-roots funding from industry contacts. • From this foundation, apply for agency funding.
Research Overview • Nonlinear Modeling for Power Amplifier Design (Modelithics) $25,000 + $25,000 State Program Match = $50,000 • Prediction of Phase Noise in Amplifiers and Frequency Multipliers (Trak Microwave) $12,000 + $6,000 State Program Match = $18,000 • Investigation of Combining Techniques for Reduced Sidelobes in Radar Power Amplifiers NRL Proposal – March 2008, $170,000 for 2 years
Research Overview • Accurate Bio-Impedance Measurements NSF Proposal - February 2008, $361,381 for 3 years • Research on a Wireless System for Transportation Applications Proposal to Sunovia Energy Systems, February 2008, 3 years • Development of Model Scoring Metrics for RF Circuit Design Proposal to Raytheon RF Components (Andover, Massachusetts), $49,500 for 1 year
Electrothermal FET Modeling • Nonlinear RF CAD Models are extracted from measurements of Field-Effect Transistors (FETs): • Current-Voltage (IV) • S-Parameters • Load Pull • Pulsed IV measurements allow thermal and trap effects to be accurately modeled.
IV Curves • The IV curves give the boundaries for the large-signal performance of the FET: Maximum Current Drain-gate breakdown ID Knee Voltage Load line for signal swing VDS
Model Equation Fitting to IV Blue Dots = Measured Red Lines = Simulated
Pulsed IV Measurements • Static measurements can be inaccurate for RF models. • The cause: Slow Thermal and Trapping Processes • Solutions: Pulsed IV and Measurements • GaN HEMT Static (Dark Lines) and Pulsed IV (Light Lines)
Pulsed IV Measurement • Measurements are performed during brief (~0.2 μs) excursions from a quiescent bias. • The pulses are usually separated by at least 1 ms. • Thermal and trap conditions during the measurement are those of the quiescent bias, as in high-frequency operation.
S G Surface Traps D Electron Flow Substrate Traps Trapping Effects • Trapping Effects in MESFETs (Charbonninud et. al): • Substrate Traps • Surface Traps • Electron Capture Fast Process • Electron Emission Slow Process
Summary of Trap Processes ID Surface Hole Capture (Slow) SLOW PROCESSES FAST PROCESSES Substrate Electron Emission (Slow) Surface Hole Capture (Slow) Substrate Electron Capture (Fast) Surface Hole Emission (Fast) Q Surface Hole Emission (Fast) VDS
Bias-Dependent Trapping Gate: Drain
Bias-Dependent FET Model New Parameters
Bias-Dependent FET Model Model with quiescent dependence: Model without quiescent dependence: Quiescent-bias dependence allows flexibility in predicting the IV curves.
Proposed Upcoming Work • Adapt USF bias-dependent approach for use on other desired models. • Add time-dependence of capture and emission trapping as well as thermal effects. • Develop a straightforward characterization scheme for the bias and time dependence of thermal and trapping effects.
Partial Jardel Circuit for Drain Traps* To calculations of backgating voltage + + Vds(t) Vcont(t) _ _ *O. Jardel, F. DeGroote, C. Charbonniaud, T. Reveyrand, J. Teyssier, R. Quere, and D. Floriot, “A Drain-Lag Model for AlGaN/GaN Power HEMTs,” IEEE International Microwave Symposium, Honolulu, Hawaii, June 2007.
Radar Power Amplifiers – NRL Proposal • Desire to reduce spectral sidelobes transmitted by shipboard radar systems. • Chireix amplifier topology:
Goals and Discussion • Desired Isolation: 100 dB outside of 40 MHz bandwidth • The pulsed signal and nonlinear amplifier use causes additional spectral components “spectral regrowth”. Reprinted from J. de Graaf, H. Faust, J. Alatishe, and S. Talapatra, “Generation of Spectrally Confined Transmitted Radar Waveforms,” Proc. IEEE Conference on Radar, 2006, pp. 76-83
Chireix Amplifier Operation • A method for operating amplifiers with high linearity and efficiency. • Based on a trigonometric identity: G cos[ω(t)+arccos(M(t))] PA Phase Modulated Signals 2GM(t)cos[ω(t)] G cos[ω(t)-arccos(M(t))] PA
Combining Challenges • A summer at microwave frequencies? • Combining Techniques • 180-degree coupler • Chireix combiner • A three-port network cannot be lossless, reciprocal, and matched at all ports. • Pros and Cons • 180-degree coupler – matched, reciprocal, and lossy (3 dB) • Chireix combiner – unmatched, reciprocal, and lossless 24
Radar PA Combining – Upcoming Work • Proposal to NRL for $170,000 over 2 years submitted March 2008 • Study different combining techniques: • Examine rejection for better spectral masks. • Continue simulation studies and eventually implement in hardware design improvements. • Meeting with NRL at USF campus on April 14.
Phase Noise Prediction • Tremendous consequences for system-level design considerations. • Example: Phase Noise in 64-PSK Amplifier • Transistor 1/f noise is a source of phase noise. • Project Goal: Predicting phase noise accurately in circuits through accurate modeling of 1/f noise.
Demonstration Circuits • Linear Amplifier • Test phase noise prediction at multiple bias currents. • Si BJT, SiGe HBT. • Designed circuits presently in test phase. • Frequency Multiplier • Test phase noise prediction due to self-biasing in large-signal operation. • Si BJT, SiGe HBT. • Circuits presently in design phase.
Microwaves and Bio – NSF Proposal In collaboration with:
Biological Motivation • Tissue composition can often be investigated through permittivity measurements: • Relative Permittivity Shows Three Dispersions: • Alpha Dispersion • Beta Dispersion • Gamma Dispersion Reprinted from H. Schwan, “Electrical Characteristics of Tissues,” Biophysik, 1963, Vol. 1, No. 3, pp. 198-208
Dispersions • Alpha Dispersion • In kHz Range • Ionic diffusion (Foster and Schwan) • Measurable with Low Frequency Impedance Analyzer • Beta Dispersion • Between 1 and 100 MHz • Capacitive charging of the cell membrane (Tamura et al.) • Can measure above this with microwave techniques • Delta Dispersion • Varying causes • Between 0.1 and 3 GHz (Foster and Schwan) • Measurable by microwave techniques • Gamma Dispersion • Dipole orientation in water molecules changes (Foster and Schwan) • 20 to 25 GHz (depending on temperature) • Measurable by microwave techniques
Measuring the Water Content of Cells • Above the Beta Dispersion, the cell membrane (a capacitor) appears invisible to the electrical signal. • The measured impedance above the Beta Dispersion is heavily dependent upon the water content of the cells. • Cancer cells often have a higher water content than healthy cells (Foster and Schwan).
Cell Culture Measurements • Cell cultures often have an impedance of 1 kΩ or higher in the microwave range. • Measuring high impedances with high precision using reflection coefficients is difficult:
Microwave Measurement Technique for High Impedances • New technique developed at Czech Technical University: Reprinted from M. Randus and K. Hoffman, “A Simple Method for Extreme Impedances Measurement,” 70th Automatic RF Techniques Group (ARFTG) Conference, Tempe, Arizona, November 2007.
Future Research • Presently constructing system to verify method of Randus and Hoffman on large impedances. • Modify cell culture impedance measurement setup of Prof. Shekhar Bhansali to perform microwave measurements. • Examine applications (i.e. clinical detection of cancer)
Conclusions • An ambitious first-year approach has allowed expansion of USF’s modeling and characterization program into design and biological applications. • A good industry base has been built, and agency proposals are being generated. • A significant number of publications, as well as additional agency and industry proposals, are expected to be generated from the present work.
Acknowledgments • Larry Cohen and Jean de Graaf, Naval Research Laboratory • Christopher Reul, USF • Brent Seward, USF • Nathaniel Varney, USF • Dorielle Price, USF • Dr. Shekhar Bhansali, USF • Dr. Larry Dunleavy, USF and Modelithics, Inc. • Martin Randus, Czech Technical Institute • Dr. Karel Hoffman, Czech Technical Institute