Evaluation of a 12 bits Video Processor for Space Application

1. Evaluation of a 12 bits Video Processor for Space Application J.-Y. Seyler, F. Malou, G. Villalon ( CNES, Toulouse - France )

2. The Context The Purpose You said « CSP » ??? CSP Functions Preliminary Tests Preliminary Selection From 5 to 3 candidates Characterization Principle Measurements Results 1 possible candidate Complementary Tests “ Lot Evaluation ” Tests Quality, Reliability & Radiations Evaluation Electrical Tests Radiations Validation Presentation Plan :

3. In space applications, analog electronics for CCD signals processing uses usually specifically designed devices such as :Asics or Hybrid Circuits ... Today : Performances needs are increasing ( maximum pixel frequency, linearity, noise ... ) While the mean power consumption should be decreased  So, commercial CMOS CCD Signal Processor ( CSP )are a possible solution to cope with all these constraints. Context (1/2) :

4. In the last years, low power CMOS CSP where introduced on the market for wide diffusion applications ( digital imaging, video, … ).  BUT : according to their incomplete datasheets it is not possibleto accept those devices in a space payloadswithout complementary measurements ! Measurements objectives : With a specifically developed electronic bench, characterization : of Critical Parameters ( linearity, noise ) and Sensibility to Environmental Influence. Context (2/2) :

5. Purpose : • In order to optimise the performance of the electronics of video equipments, we have tested several “ Video Processors ”( or CSP = “ CCD Signal Processor ” or AFE = “ Analog Front End ” ). • PRELIMINARY TESTS : • These tests were based on : • Latchup sensitivity • Electrical performances ( some tests at several temperatures ) • They have then allowed to select one possible candidate. • LOT EVALUATION TESTS : • So, we have bought several parts from the same lot ( 2 sub-lots ) • and performed a “ Lot Evaluation ” : • Lot Qualification ( “ COTS ” philosophy ) • Radiation sensitivity ( Latchup, Total Dose, Single Event Upset )

6. The Analog Video Signal Processing The CSP Function You said : “ CSP ” ??? :

7. Analog Video Signal Processing : Video Chain N bits Analog Processing Electronics Analog to Digital Conversion Interfaceto Digital Devices Photons Detector CCD PROCESSOR Detector Implementation Electronics Timing Generator Power Supply • 1 single consumer “ Off-the-shelf ” electronics component may replace several functions

8. What is an CSP, « CCD Signal Processor » ? It is a Integrated Circuit which is usually composed of the following elements : Input DC value compensation ( Clamp ), Correlated Double Sampling ( CDS ), Signal scaling by Variable Gain Amplifier ( VGA ), Analog to Digital Converter ( ADC ), Offset Calibration Loop based on Dark Pixels. Additional functions : DAC, auxiliary A / D… You said « CSP » ???

9. Gain and A/D Conversion ADCCLK CCD IN SHP A/D CDS VGA CONVERTER CLPDM SHD CLPOB OFFSET REGISTER Input Clamp Correlated Double Sampling Dark Pixel Offset Correction CSP Functions :

10. Latch-Up sensitivity Test Electrical Characterization Selection Criteria Preliminary Selection :

11. Latch-Up sensitivity Test ( CNES Quality Dep t ) : Bibliographic survey Elimination of several fab-less candidates 5 types among 2 manufacturers Latch-up tests 3 candidates among 2 manufacturers Full Electrical Characterization : Inter-calibration with other bench ( on 1 part already tested ) Tests ( @ SODERN ) 1 only candidateleft Preliminary Selection :

12. Criteria & Selected CSPs : • Our need : • 1 Channel only, • Resolution = 12 bits, • 20 MSamples / Second • Offset calibration loop ( based on dark pixels ) • Programmable Gain : ~ 0  40 dB. • We have eventually selected 3 CSPs : • Candidate 1 ( Analog Devices ) : 70 mW • Candidate 2 ( Texas Instruments ) : 80 mW • Candidate 3 ( Texas Instruments ) : 75 mW, Low Latchup sensitivity

13. SEL Sensitivity / LET :

14. Test Bench presentation General Performances of the CSP Complementary tests of the candidate Thermal Characterization & Radiation Tests Preliminary Tests :

15. Pattern Generation • Bench Configuration • I/O bench DAC 16 bits ClocksSynthesis • Performances computation • Graphic display • Storage Control Computer Real Timerecording CSP under Test Data exploitation Characterization Principle :

16. Bench : • Video stimuli waveform • Performances : • 9.25 Mhz maxi pixel frequency • Better than +/- 2 LSB (12) integ. linearity Benchmark and Evaluation Board

17. Differential Non Linearity Integral Non Linearity Noise Performance General Performancesof the CSP :

18. Differential Non Linearity Performance :

19. Integral Non Linearity Performance :

20. Noise Performance :

21. Measurements Results : • Differential Non Linearity performance • Integral Non Linearity performance • Noise performance • Comparison versus “ Space application ” requirements : •  Compatible with high performances applications  • … but with complementary measurements !

22. Complementary Electrical Tests Total Dose Tests Complementary Tests :

23. Complementary Tests (1/3) : • Complementary Electrical Tests : • Some additional electrical tests ( @ room temp ) • Tests at : - 20 °C, + 25 °C, + 70 °C CSP • Total Dose Tests : • Some concerns about dose rate( “ Rebound Effect ” ? )

24. Electrical Tests made at ambient temperature,and related with project specifications : Pleiades Satellites needs + Specific tests for next projects( “ Post Pleiades ” & Scientific Payloads ) : Large Reset peak Saturated pixel Clamp efficiency ( V_ref influence for V_util = V_ref = Ct ) Offset correction Complementary Tests (2/3) :

25. Complementary Tests (3/3) :

26. Quality, Reliability Electrical Tests Radiations Validation Lot Evaluation :

27. Procurement of “ Commercial Quality Level ”& “ Extended ” Temperature Range ( -20°,+85°C ) Purpose : Quality, Reliability & Radiations Evaluation The Future : “ Lot Evaluation ”(at CNES)

28. Procurement 750P – DC0501 250P – DC044 Performance Characterization 6P DC0440 Construction Analysis 6P DC0501 11P TID + 5P SEU DC0501 Radiation Test : TID + SEU Serialization 13P DC0501 Electrical Characterization -40°C/–20°C / +25°C / +75°C/+125°C 13P DC0501 3P Reference Life Test 10P Electrical Measurement -40°C/+25°C/+125°C 10P DC0501 DPA 1P Final Report Quality,Reliability &RadiationsEvaluation

29. Developed @ CNES Qual. laboratory for : Biasing the component ( Stimuli Generation ) Static & Dynamic performances. EXA3000 • DNL, INLExtraction • Functional • Characterization : AC CSP under TEST DC D1 1 D10 D9 DAC 16 bits D8 FPGA Din D7 D6 Ramp D5 1 > f > 600 MSPS D4 CCD Format D3 D2 Pin D1 D0 8 Bits DAC 8 Bits DAC Specific Test Bench : • FPGA delivers different digital stimuli which are transferred througha 16bits Digital to Analog Converterat the input of the CSP. • The EXA3000( ATE ) tester ensures the control signals generation, the data reception and the processing( parameters extraction )

30. Up rating / Electrical characterization at 5 temp. : - 20 °C / + 25 °C / + 75 °C  conformity with the manufacturer’s datasheet - 40 °C & + 125 °C  possibility of temperature range extension ? Dynamic Life Test (10 parts) : 2000 hours, T = 125 °C, Vcc = 3.3 V Intermediate electrical measurement : 168 h, 500 h, 1000 h@ Tamb = 25 °C with F = 15 Msps. The final measurement will be done at 3 temperatures. Final DPA Construction Analysis ( 6 parts ) : Identify & describe the Front-End and Back-End technologies. Electrical Tests :

31. Total Ionizing Dose : 11 parts ( 8 On, 2 Off, 1 Ref. ) with ONERA DESP Cobalt60 Source Total Dose : 15Krad ( Si ) & 30Krad ( 2 lots ) @ 30 rad / h Low Dose Rate ( because of the “Rebound Effect”found after 14 krads in previous TID test ) Annealing : 24 h / 25 °C + 168 h / 100 °C All the datasheet parameters : measured at ambient temperature & 15 Msps. Heavy Ions Tests : Previous tests showed that the CSP is not sensitive to Single Event Latch-up for a LET of 60 MeV / mg . cm ² Single Event Effect ( Transient, Upset or Functional Interrupt ) UCL ( Belgium ) heavy ions facilities + specific test bench( stimuli, count, record events ) with TRAD support. Radiations Validation :

32. At the end of the validation of the lot (beginning 2007), we will be able to answer to the question : “ Is our selected CSP, coming from commercial procurement recommended for usage in our spaceflight applications ??? ” Conclusion :